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Development of the thin film with high thermal conductivity for power devices

Type: Conference Paper

Publisher: IEEE

Year: 2014

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Type: Journal Paper

Author : Qian Wu; Bayerl, A.; Porti, M.; Martin-Martinez, J.; Lanza, Mario; Rodriguez, Roberto; Velayudhan, V.; Nafria, M.; Aymerich, X.; Bargallo Gonzalez, Mireia; Simoen, Eddy

Publisher: IEEE

Year: 2014

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Development of the thin film with high thermal conductivity for power devices

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

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Development of the thin film with high thermal conductivity for power devices

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs