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Large Scale Discriminative Metric Learning

Type: Conference Paper

Author : Kirchner, Peter D.; Boehm, Matthias; Reinwald, Berthold; Sow, Daby; Schmidt, Michael; Turaga, Deepak; Biem, Alain

Publisher: IEEE

Year: 2014

VTC 2014 Fall Program

Type: Conference Paper

Publisher: IEEE

Year: 2014

Ultrasensitive digital detection of nanoparticles: Viral diagnostics and multiplexed protein and nucleic acid assays

Type: Conference Paper

Author : Unlu, M.S.

Publisher: IEEE

Year: 2014

Silicon-on-insulator (SOI) nanowire hot carrier electroluminescence

Type: Conference Paper

Author : du Plessis, Monuko; Venter, Petrus J.

Publisher: IEEE

Year: 2014

Author

Biem, Alain (1)

Boehm, Matthias (1)

du Plessis, Monuko (1)

Kirchner, Peter D. (1)

Reinwald, Berthold (1)

Schmidt, Michael (1)

Sow, Daby (1)

Turaga, Deepak (1)

Unlu, M.S. (1)

Venter, Petrus J. (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

n OSI model (3)

Internet of Things (2)

n Internet of Things (2)

n open systems (2)

computer networks (1)

DC motors (1)

n access protocols (1)

n algorithmic organization (1)

n angular position information (1)

n ankle joints (1)

Type

Conference Paper (4)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

hotonics Conference (IPC), 2014 IEEE (2)

arallel &amp; Distributed Processing Symposium Workshops (IPDPSW), 2014 IEEE International (1)

ehicular Technology Conference (VTC Fall), 2014 IEEE 80th (1)

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