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    Calibration device for quantifying error in force plates 

    Type: Conference Paper
    Author : Kaplan, Jonathan; Kelley, Mireille; Williams, John; Gielo-Perczak, Krystyna
    Publisher: IEEE
    Year: 2014

    Automated surgical step recognition in normalized cataract surgery videos 

    Type: Conference Paper
    Author : Charriere, K.; Quellec, G.; Lamard, M.; Coatrieux, G.; Cochener, B.; Cazuguel, G.
    Publisher: IEEE
    Year: 2014

    Rule-based engineering using declarative graph database queries 

    Type: Conference Paper
    Author : Gruner, S.; Weber, P.; Epple, U.
    Publisher: IEEE
    Year: 2014

    Analysis of TFET based 6T SRAM cells implemented with state of the art silicon nanowires 

    Type: Conference Paper
    Author : Strangio, S.; Palestri, P.; Esseni, D.; Selmi, L.; Crupi, F.
    Publisher: IEEE
    Year: 2014

    Message from the General Chair 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Characterization of ferrite materials used as a core for multi-phase coupled inductors 

    Type: Conference Paper
    Author : Lecic, Nikola; Kuniyil, Akhil Chandran Mukkattu; Stojanovic, Goran
    Publisher: IEEE
    Year: 2014

    Investigations on fractal square loop FSS at oblique incidence for GSM applications 

    Type: Conference Paper
    Author : Seman, F.C.; Khalid, N.K.
    Publisher: IEEE
    Year: 2014

    Oil spill detection in SAR images using multiscale normalized cut segmentation 

    Type: Conference Paper
    Author : Xianwen Ding; Xiaofeng Li; Peng Liu; Yongliang Wei; Shuolin Huang; Junsheng Zhong
    Publisher: IEEE
    Year: 2014

    Channel noise reduction for compressed images using singular value decomposition 

    Type: Conference Paper
    Author : Manchanda, M.; Gambhir, D.
    Publisher: IEEE
    Year: 2014

    Measurement and analysis of marine pilot's performance using a large model sensor 

    Type: Conference Paper
    Author : Kitamura, Kenichi; Murai, Koji; Hayashi, Yuji; Fujita, Takayuki; Maenaka, Kazusuke
    Publisher: IEEE
    Year: 2014
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