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    Reconfigurable Concurrent dual-band Low Noise Amplifier for noninvasive vital sign detection applications 

    Type: Conference Paper
    Author : Kumar, Amarjit; Pathak, Nagendra P.
    Publisher: IEEE
    Year: 2014

    Roaming electric vehicle charging and billing: An anonymous multi-user protocol 

    Type: Conference Paper
    Author : Mustafa, Mustafa A.; Zhang, Ning; Kalogridis, Georgios; Fan, Zhong
    Publisher: IEEE
    Year: 2014

    Study of relativistic virtode in CST Particle Studio 

    Type: Conference Paper
    Author : Kurkin, S.A.; Rak, A.O.; Kuraev, A.A.; Koronovskii, A.A.; Hramov, A.E.
    Publisher: IEEE
    Year: 2014

    Availability of load to provide frequency response in the great Britain power system 

    Type: Conference Paper
    Author : Cheng, Meng; Wu, Jianzhong; Galsworthy, Stephen; Jenkins, Nick; Hung, William
    Publisher: IEEE
    Year: 2014

    Fingerprint multilateration for automatically classifying evolved Prisoner's Dilemma agents 

    Type: Conference Paper
    Author : Tsang, Jeffrey
    Publisher: IEEE
    Year: 2014

    Monolithic integration of photonic devices in SiGe BiCMOS 

    Type: Conference Paper
    Author : Zimmermann, L.; Knoll, D.; Lischke, S.; Petousi, D.; Kroh, M.; Winzer, G.; Heinemann, B.; Ostrovskyy, P.; Micusik, D.; Lisker, M.; Fursenko, O.; Marschmeyer, S.; Yamamoto, Y.; Voigt, K.; Wohlfeil, B.; Tillack, B.; Petermann, K.
    Publisher: IEEE
    Year: 2014

    Black-start scheme based on EV's intelligent integrated station 

    Type: Conference Paper
    Author : Sun, Junbo; Xie, Da; Lou, Yucheng; Yang, Minxia; Zhang, Yu
    Publisher: IEEE
    Year: 2014

    Conference program 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Antenna range evaluations of low THz imagers for automotive applications 

    Type: Conference Paper
    Author : Vizard, David R; Gashinova, M.; Hoare, E.G.; Jasteh, D.; Daniel, L.; Cherniakov, M.; Tran, T-Y; Clarke, N.
    Publisher: IEEE
    Year: 2014

    Neutron Induced Single Event Upset (SEU) Testing of Static Random Access Memory (SRAM) Devices 

    Type: Conference Paper
    Author : Tostanoski, Michael J.; Deaton, Terrence F.; Strayer, Roy E.; Goldflam, Rudolf; Fullem, Travis Z.
    Publisher: IEEE
    Year: 2014
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