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Towards surround stereo vision: Analysis of a new surround view camera configuration for driving assistance applications

Type: Conference Paper

Author : Esparza, Jose; Helmle, Michael; Jahne, Bernd

Publisher: IEEE

Year: 2014

Cross-Layer Modeling and Simulation of Circuit Reliability

Type: Journal Paper

Author : Yu Cao; Velamala, Jyothi; Sutaria, Ketul; Chen, Mike Shuo-Wei; Ahlbin, Jonathan; Sanchez Esqueda, Ivan; Bajura, Michael; Fritze, Michael

Publisher: IEEE

Year: 2014

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

Type: Journal Paper

Author : Kukner, Halil; Khan, Sharifullah; Weckx, Pieter; Raghavan, Praveen; Hamdioui, Said; Kaczer, Ben; Catthoor, Francky; Van der Perre, Liesbet; Lauwereins, Rudy; Groeseneken, Guido

Publisher: IEEE

Year: 2014

Author index

Type: Conference Paper

Publisher: IEEE

Year: 2014

Adaptive Technique for Overcoming Performance Degradation Due to Aging on 6T SRAM Cells

Type: Journal Paper

Author : Faraji, Rasoul; Naji, Hamid Reza

Publisher: IEEE

Year: 2014

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Towards surround stereo vision: Analysis of a new surround view camera configuration for driving assistance applications

Cross-Layer Modeling and Simulation of Circuit Reliability

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

Author index

Adaptive Technique for Overcoming Performance Degradation Due to Aging on 6T SRAM Cells

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Towards surround stereo vision: Analysis of a new surround view camera configuration for driving assistance applications

Cross-Layer Modeling and Simulation of Circuit Reliability

Comparison of Reaction-Diffusion and Atomistic Trap-Based BTI Models for Logic Gates

Author index

Adaptive Technique for Overcoming Performance Degradation Due to Aging on 6T SRAM Cells