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A pattern recognition for group abnormal behaviors based on Markov Random Fields energy

Type: Conference Paper

Author : Li Zuojin; Chen Liukui; Ren Zhiyong; Tirumala, S.S.

Publisher: IEEE

Year: 2014

Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection

Type: Journal Paper

Author : Lin, Dongyang; Hong, Tianqi; Yanjing Li; Eswaran, S.; Kumar, Sudhakar; Fallah, F.; Hakim, N.; Gardner, Donald S.; Mitra, Subhasish

Publisher: IEEE

Year: 2014

Author

Chen Liukui (1)

Eswaran, S. (1)

Fallah, F. (1)

Gardner, Donald S. (1)

Hakim, N. (1)

Hong, Tianqi (1)

Kumar, Sudhakar (1)

Li Zuojin (1)

Lin, Dongyang (1)

Mitra, Subhasish (1)

Publisher

IEEE (2)

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2014 (2)

Keywords

Computer bugs (2)

logic bugs (2)

Multicore processing (2)

post-silicon validation (2)

System-on-chip (2)

Abstracts (1)

bug scenarios (1)

clock cycles (1)

Clocks (1)

commercial multicore SoC (1)

Type

Conference Paper (1)

Journal Paper (1)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on (1)

ognitive Informatics &amp; Cognitive Computing (ICCI*CC), 2014 IEEE 13th International Conferenc (1)

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