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RISThe effect of light illumination in photoionization of deep traps in GaN MESFETs buffer layer using an ensemble Monte Carlo simulation
Year: 2011
Abstract:
centers are responsible for
current collapse in GaN MESFET at low temperatures. These electrical traps degrade the performance of
the device at low temperature. On the opposite, a light-induced increase in the trap-limited drain current...
Automatic Recognition Method for Checkbox in Data Form Image
Publisher: IEEE
Year: 2014
Reviewers
Publisher: IEEE
Year: 2014
Multichannel EMG acquisition system for arm and forearm signal detection
Publisher: IEEE
Year: 2014
A unified approach for successive release of a software under two types of imperfect debugging
Publisher: IEEE
Year: 2014
Non-Invasive Recognition of Poorly Resolved Integrated Circuit Elements
Publisher: IEEE
Year: 2014
Table of contents
Year: 2014
Research on Chinese Polar Knowledge Repository and its Infrastructure
Publisher: IEEE
Year: 2014