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Design of a Counter-Based DPWM Using RC Charge

Type: Conference Paper

Author : Hsin Chuan Chen

Publisher: IEEE

Year: 2014

Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory

Type: Journal Paper

Author : Mahalanabis, Debayan; Barnaby, H.J.; Kozicki, M.N.; Bharadwaj, Vineeth; Rajabi, Saba

Publisher: IEEE

Year: 2014

Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling

Type: Journal Paper

Author : Zebrev, Gennady /I/.; Vatuev, Alexander S.; Useinov, Rustem G.; Emeliyanov, Vladimir V.; Anashin, Vasily S.; Gorbunov, Maxim S.; Turin, Valentin O.; Yesenkov, Kirill /A/.

Publisher: IEEE

Year: 2014

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Design of a Counter-Based DPWM Using RC Charge

Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory

Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling

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Design of a Counter-Based DPWM Using RC Charge

Investigation of Single Event Induced Soft Errors in Programmable Metallization Cell Memory

Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling