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Investigation of Backgate-Bias Dependence of Threshold-Voltage Sensitivity to Process and Temperature Variations for Ultra-Thin-Body Hetero-Channel MOSFETs

Type: Journal Paper

Author : Chang-Hung Yu; Pin Su

Publisher: IEEE

Year: 2014

Built-in Effective Body-Bias Effect in Ultra-Thin-Body Hetero-Channel III—V-on-Insulator n-MOSFETs

Type: Journal Paper

Author : Chang-Hung Yu; Pin Su

Publisher: IEEE

Year: 2014

Evaluation of Sub-0.2 V High-Speed Low-Power Circuits Using Hetero-Channel MOSFET and Tunneling FET Devices

Type: Journal Paper

Author : Yin-Nien Chen; Ming-Long Fan; Hu, Vita Pi-Ho; Pin Su; Ching-Te Chuang

Publisher: IEEE

Year: 2014

Author

Pin Su (3)

Chang-Hung Yu (2)

Ching-Te Chuang (1)

Hu, Vita Pi-Ho (1)

Ming-Long Fan (1)

Yin-Nien Chen (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

MOSFET (3)

Logic gates (2)

Backgate bias (1)

backgate-bias dependence (1)

Capacitance (1)

conduction band (1)

conduction bands (1)

Delays (1)

DOX device design (1)

drain induced barrier lowering (1)

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Journal Paper (3)

Language (ISO)

English (3)

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Metadata Only (3)

Publication Title

Circuits and Systems I: Regular Papers, IEEE Transactions on (1)

Device and Materials Reliability, IEEE Transactions on (1)

Electron Device Letters, IEEE (1)

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