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Now showing items 1-10 of 65

Extending the bandwidth of low-noise microwave amplifier through digital assist

Type: Journal Paper

Author : Stewart, Darryl; Saavedra, Carlos E.

Publisher: IET

Year: 2014

Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias

Type: Journal Paper

Author : Wei Feng; Chun Meng Dou; Niwa, Masaaki; Yamada, Koji; Ohmori, Kenji

Publisher: IEEE

Year: 2014

Asymmetric Doherty Power Amplifier Designed Using Model-Based Nonlinear Embedding

Type: Journal Paper

Author : Haedong Jang; Roblin, Patrick; Quindroit, Christophe; Yiqiao Lin; Pond, Robert D.

Publisher: IEEE

Year: 2014

Poster abstract: Implications of target diversity for organic device-free localization

Type: Conference Paper

Publisher: IEEE

Year: 2014

Quantitative model verification in VANET based on interval probabilistic timed automata

Type: Conference Paper

Author : Qiang Li , Xiaoyan Wang , Shufen Liu

Publisher: IEEE

Year: 2014

Wave: Trigger Based Synchronous Data Process System

Type: Conference Paper

Publisher: IEEE

Year: 2014

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

Type: Journal Paper

Author : Zhaoyun Tang; Bo Tang; Lichuan Zhao; Guilei Wang; Jing Xu; Yefeng Xu; Hongli Wang; Dahai Wang; Junfeng Li; Fujiang Lin; Jiang Yan; Chao Zhao; Tianchun Ye

Publisher: IEEE

Year: 2014

NiCo nanoparticles-doped ZnO nano array and The Magnetic Properties

Type: Conference Paper

Author : Chen, Yi; Chen, Longyi; Zhang, Jin

Publisher: IEEE

Year: 2014

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Type: Journal Paper

Author : I-Chung Chiu; I-Chun Cheng

Publisher: IEEE

Year: 2014

Impact of Donor Traps on the 2DEG and Electrical Behavior of AlGaN/GaN MISFETs

Type: Journal Paper

Author : Longobardi, Giorgia; Udrea, F.; Sque, Stephen; Hurkx, Godefridus Adrianus Maria; Croon, Jeroen; Napoli, E.; Sonsky, Jan

Publisher: IEEE

Year: 2014

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Extending the bandwidth of low-noise microwave amplifier through digital assist

Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias

Asymmetric Doherty Power Amplifier Designed Using Model-Based Nonlinear Embedding

Poster abstract: Implications of target diversity for organic device-free localization

Quantitative model verification in VANET based on interval probabilistic timed automata

Wave: Trigger Based Synchronous Data Process System

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

NiCo nanoparticles-doped ZnO nano array and The Magnetic Properties

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Impact of Donor Traps on the 2DEG and Electrical Behavior of AlGaN/GaN MISFETs

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Extending the bandwidth of low-noise microwave amplifier through digital assist

Impact of Random Telegraph Noise Profiles on Drain-Current Fluctuation During Dynamic Gate Bias

Asymmetric Doherty Power Amplifier Designed Using Model-Based Nonlinear Embedding

Poster abstract: Implications of target diversity for organic device-free localization

Quantitative model verification in VANET based on interval probabilistic timed automata

Wave: Trigger Based Synchronous Data Process System

Impacts of Back Gate Bias Stressing on Device Characteristics for Extremely Thin SoI (ETSoI) MOSFETs

NiCo nanoparticles-doped ZnO nano array and The Magnetic Properties

Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering

Impact of Donor Traps on the 2DEG and Electrical Behavior of AlGaN/GaN MISFETs