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    Silicon Photomultipliers Electrical Model Extensive Analytical Analysis 

    Type: Journal Paper
    Author : Marano, Davide; Belluso, Massimiliano; Bonanno, Giovanni; Billotta, Sergio; Grillo, Alessandro; Garozzo, Salvatore; Romeo, Giuseppe; Catalano, O.; La Rosa, G.; Sottile, G.; Impiombato, D.; Giarrusso, S.
    Publisher: IEEE
    Year: 2014

    Single-chip CMUT-on-CMOS front-end system for real-time volumetric IVUS and ICE imaging 

    Type: Journal Paper
    Author : Gurun, G.; Tekes, Coskun; Zahorian, Jaime; Xu, Tao; Satir, S.; Karaman, Mustafa; Hasler, J.; Degertekin, F. Levent
    Publisher: IEEE
    Year: 2014

    Waveform-Sampling Electronics for a Whole-Body Time-of-Flight PET Scanner 

    Type: Journal Paper
    Author : Ashmanskas, W.J.; LeGeyt, B.C.; Newcomer, F.M.; Panetta, J.V.; Ryan, W.A.; Van Berg, R.; Wiener, Rony /I/.; Karp, Joel S.
    Publisher: IEEE
    Year: 2014

    PADI, an Ultrafast Preamplifier - Discriminator ASIC for Time-of-Flight Measurements 

    Type: Journal Paper
    Author : Ciobanu, M.; Herrmann, N.; Hildenbrand, K.D.; Kis, M.; Schuttauf, A.; Flemming, H.; Deppe, H.; Lochner, S.; Fruhauf, J.; Deppner, I.; Loizeau, P.A.; Trager, M.
    Publisher: IEEE
    Year: 2014

    Vector loop RAIM in nominal and GNSS-stressed environments 

    Type: Journal Paper
    Author : Bhattacharyya, Souvik; Gebre-Egziabher, Demoz
    Publisher: IEEE
    Year: 2014

    Early second millennium settlement landscape in the Nami Region, Israel, revealed by GPR investigations 

    Type: Conference Paper
    Author : Salmon, Yossi; Conyers, Lawrence; Jol, Harry; Artzy, Michal
    Publisher: IEEE
    Year: 2014

    Streamer and breakdown phenomena under step and lightning impulses in various hydrocarbon liquids 

    Type: Conference Paper
    Author : Denat, A.; Lesaint, O.; Mc Cluskey, F.
    Publisher: IEEE
    Year: 2014

    Visión artificial y Filtro de Kalman aplicados al control de un péndulo invertido 

    Type: Conference Paper
    Author : Garayalde, Damian A. , Negri, Pablo
    Publisher: IEEE
    Year: 2014

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