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Now showing items 1-10 of 10

Characterization of the consistency of healthcare components using LDA

Type: Conference Paper

Author : Belinski, R. , Henderson, M.M.

Publisher: IEEE

Year: 2014

A time-dependent link failure model for wireless sensor networks

Type: Conference Paper

Publisher: IEEE

Year: 2014

Effects of fin width on high-<sub>??</sub>/metal gate bulk FinFET devices

Type: Journal Paper

Author : Chien-Hung Chen; Ying-Chien Fang; Sheng-Yuan Chu

Publisher: IET

Year: 2014

Vision based hand gesture recognition using eccentric approach for human computer interaction

Type: Conference Paper

Author : Bhame, Vishal; Sreemathy, R.; Dhumal, Hrushikesh

Publisher: IEEE

Year: 2014

ALD TiN Barrier Metal for pMOS Devices With a Chemical Oxide Interfacial Layer for 20-nm Technology Node

Type: Journal Paper

Author : Ying-Tsung Chen; Chien-Ting Lin; Wen-Tai Chiang; Mon-Sen Lin; Chih-Wei Yang; Jian-Cun Ke; Shoou-Jinn Chang

Publisher: IEEE

Year: 2014

A novel and scalable LED communication system

Type: Conference Paper

Year: 2014

De-rating design and analysis for safety and reliability

Type: Conference Paper

Author : Zhaofeng Huang

Publisher: IEEE

Year: 2014

Semi-physical simulation system of autonomous optical navigation for Mars-approaching phase

Type: Conference Paper

Author : Huang, An-yi; Cui, Wen; Li, Heng-nian

Publisher: IEEE

Year: 2014

Mitigation of Reverse Short-Channel Effect With Multilayer TiN/Ti/TiN Metal Gates in Gate Last PMOSFETs

Type: Journal Paper

Author : Lichuan Zhao; Zhaoyun Tang; Bo Tang; Xueli Ma; Jinbiao Liu; Jinjuan Xiang; Jianfeng Gao; Chunlong Li; Xiaobin He; Cheng Jia; Mingzheng Ding; Hong Yang; Yefeng Xu; Jing Xu; Hongli Wang; Peng Liu; Peizhen Hong; Lingkuan Meng; Tingting Li; Wenjuan Xiong; Hao Wu; Junjie Li; Guilei Wang; Tao Yang; Hushan Cui; Yihong Lu; Xiaodong Tong; Jun Luo; Jian Zhong; Qiang Xu; Wenwu Wang; Junfeng Li; Huilong Zhu; Chao Zhao; Jiang Yan; Dapeng Chen; Yang, Songping; Tianchun Ye

Publisher: IEEE

Year: 2014

Radiation Induced Charge Trapping in Sputtered <formula formulatype="inline"> <img src="/images/tex/21489.gif" alt="{\\rm ZrO}_{\\rm 2} !! : !! {\\rm N}"> </formula> Dielectric Thin Films on Silicon

Type: Journal Paper

Author : Rao, Akhila; Dsa, Joyline; Goyal, Shri; Singh, B. Raja

Publisher: IEEE

Year: 2014

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Characterization of the consistency of healthcare components using LDA

A time-dependent link failure model for wireless sensor networks

Effects of fin width on high-<sub>??</sub>/metal gate bulk FinFET devices

Vision based hand gesture recognition using eccentric approach for human computer interaction

ALD TiN Barrier Metal for pMOS Devices With a Chemical Oxide Interfacial Layer for 20-nm Technology Node

A novel and scalable LED communication system

De-rating design and analysis for safety and reliability

Semi-physical simulation system of autonomous optical navigation for Mars-approaching phase

Mitigation of Reverse Short-Channel Effect With Multilayer TiN/Ti/TiN Metal Gates in Gate Last PMOSFETs

Radiation Induced Charge Trapping in Sputtered <formula formulatype="inline"> <img src="/images/tex/21489.gif" alt="{\\rm ZrO}_{\\rm 2} !! : !! {\\rm N}"> </formula> Dielectric Thin Films on Silicon

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Characterization of the consistency of healthcare components using LDA

A time-dependent link failure model for wireless sensor networks

Effects of fin width on high-<sub>??</sub>/metal gate bulk FinFET devices

Vision based hand gesture recognition using eccentric approach for human computer interaction

ALD TiN Barrier Metal for pMOS Devices With a Chemical Oxide Interfacial Layer for 20-nm Technology Node

A novel and scalable LED communication system

De-rating design and analysis for safety and reliability

Semi-physical simulation system of autonomous optical navigation for Mars-approaching phase

Mitigation of Reverse Short-Channel Effect With Multilayer TiN/Ti/TiN Metal Gates in Gate Last PMOSFETs

Radiation Induced Charge Trapping in Sputtered <formula formulatype="inline"> <img src="/images/tex/21489.gif" alt="{\\rm ZrO}_{\\rm 2} !! : !! {\\rm N}"> </formula> Dielectric Thin Films on Silicon