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Structural Analyses of the Cold Mass for High Field Dusty Plasma Experiment

Type: Journal Paper

Author : Miller, C.E.; Radovinsky, A.; Pourrahimi, Shahin

Publisher: IEEE

Year: 2014

Interfacial Failure in Flexible Electronic Devices

Type: Journal Paper

Author : Hang Chen; Bing-Wei Lu; Yuan Lin; Xue Feng

Publisher: IEEE

Year: 2014

Reliability of Circular Systems With Markov Dependencies

Type: Journal Paper

Author : Atalay, Sevcan Demir; Zeybek, Melis

Publisher: IEEE

Year: 2014

Author

Atalay, Sevcan Demir (1)

Bing-Wei Lu (1)

Hang Chen (1)

Miller, C.E. (1)

Pourrahimi, Shahin (1)

Radovinsky, A. (1)

Xue Feng (1)

Yuan Lin (1)

Zeybek, Melis (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

failure criteria (3)

Stress (2)

$():F()$&lt (1)

&gt (1)

&lt (1)

/formula&gt (1)

/tex&gt (1)

Circular &lt (1)

circular &lt (1)

circular systems reliability (1)

Type

Journal Paper (3)

Language (ISO)

English (3)

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Metadata Only (3)

Publication Title

Applied Superconductivity, IEEE Transactions on (1)

Electron Device Letters, IEEE (1)

Reliability, IEEE Transactions on (1)

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