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Monitoring Quality Characteristics Using Linear Profile

Type: Conference Paper

Author : , Noorosana; , Amiri; , Vaghefi; , Roghanian

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Monitoring Quality Characteristics Using Linear Profile

Type: Conference Paper

Author : Noorosana, Amiri, Vaghefi, Roghanian

Plasmonic switches

Type: Conference Paper

Publisher: IEEE

Year: 2014

On-the-Fly Massively Multitemporal Change Detection Using Statistical Quality Control Charts and Landsat Data

Type: Journal Paper

Author : Brooks, Evan B.; Wynne, Randolph H.; Thomas, Varghese; Blinn, Christine E.; Coulston, John W.

Publisher: IEEE

Year: 2014

Improving MapReduce Performance Using Smart Speculative Execution Strategy

Type: Journal Paper

Author : Qi Chen; Cheng Liu; Zhen Xiao

Publisher: IEEE

Year: 2014

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

Type: Journal Paper

Author : Chen-Fu Chien; Ying-Jen Chen; Chia-Yu Hsu; Hung-Kai Wang

Publisher: IEEE

Year: 2014

Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products

Type: Journal Paper

Author : Ying Zheng; Wong, David Shan-Hill; Yan-Wei Wang; Huajing Fang

Publisher: IEEE

Year: 2014

Robustness Analysis of Mixed Product Run-to-Run Control for Semiconductor Process Based on ODOB Control Structure

Type: Journal Paper

Author : An-Chen Lee; Jeng-Haur Horng; Tzu-Wei Kuo; Nan-Hung Chou

Publisher: IEEE

Year: 2014

Edge based directional features for English-Bengali script recognition

Type: Conference Paper

Author : Tikader, A. , Puhan, N.B.

Publisher: IEEE

Year: 2014

Temperature measurement of power electronics devices based on SAW sensors

Type: Conference Paper

Author : Blaszczyk, Pawel; Wojcik, Mariusz; Baszynski, Michal

Publisher: IEEE

Year: 2014

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Monitoring Quality Characteristics Using Linear Profile

Monitoring Quality Characteristics Using Linear Profile

Plasmonic switches

On-the-Fly Massively Multitemporal Change Detection Using Statistical Quality Control Charts and Landsat Data

Improving MapReduce Performance Using Smart Speculative Execution Strategy

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products

Robustness Analysis of Mixed Product Run-to-Run Control for Semiconductor Process Based on ODOB Control Structure

Edge based directional features for English-Bengali script recognition

Temperature measurement of power electronics devices based on SAW sensors

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Monitoring Quality Characteristics Using Linear Profile

Monitoring Quality Characteristics Using Linear Profile

Plasmonic switches

On-the-Fly Massively Multitemporal Change Detection Using Statistical Quality Control Charts and Landsat Data

Improving MapReduce Performance Using Smart Speculative Execution Strategy

Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller

Takagi&#x2013;Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products

Robustness Analysis of Mixed Product Run-to-Run Control for Semiconductor Process Based on ODOB Control Structure

Edge based directional features for English-Bengali script recognition

Temperature measurement of power electronics devices based on SAW sensors

Takagi–Sugeno Model Based Analysis of EWMA RtR Control of Batch Processes With Stochastic Metrology Delay and Mixed Products