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Enhancement in IEEE 1500 standard for at-speed test and debug

Type: Conference Paper

Author : Ali, Ghazanfar; Hussin, Fawnizu Azmadi; Zain Ali, Noohul Basheer; Hamid, Nor Hisham; Adnan, Raja Mahmud

Publisher: IEEE

Year: 2014

Eddy Current Loss Estimation of Edge Burr-Affected Magnetic Laminations Based on Equivalent Electrical Network—Part I: Fundamental Concepts and FEM Modeling

Type: Journal Paper

Author : Hamzehbahmani, Hamed; Anderson, Patrick; Hall, Jeffrey; Fox, D.

Publisher: IEEE

Year: 2014

Improved Supercapacitor Floating Ageing Interpretation Through Multipore Impedance Model Parameters Evolution

Type: Journal Paper

Author : German, Reinhard; Venet, Pascal; Sari, Ali; Briat, Olivier; Vinassa, Jean-Michel

Publisher: IEEE

Year: 2014

Equivalent Electrical Model and Software Tool for SPICE-Compatible Thermal Simulations of High-Power Resistors

Type: Journal Paper

Author : Nuno, Fernando; Parrondo, Jorge; Pernia, Alberto M.; Barrio, R.; Villegas, Pedro J.; Prieto, Miguel J.; Barquilla, Pastora

Publisher: IEEE

Year: 2014

Fragmental Frequency Analysis Method to Estimate Electrical Cell Parameters From Bioimpedance Study

Type: Journal Paper

Author : Das, Divya; Kamil, Farhan Ahmad; Agrawal, Sanjay; BISWAS, KAMANASHIS; Das, S.

Publisher: IEEE

Year: 2014

Gene expression profiling by estimating parameters of gene regulatory network using simulated annealing: A comparative study

Type: Conference Paper

Author : Biswas, S. , Acharyya, S.

Publisher: IEEE

Year: 2014

A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14µA sleep current using Reverse Body Bias Assisted 65nm SOTB CMOS technology

Type: Conference Paper

Publisher: IEEE

Year: 2014

A novel design and characterization for 67GHz NLTL-based harmonic phase reference

Type: Conference Paper

Author : Gou, Yuanxiao; Fu, Jiahui; Lin, Maoliu

Publisher: IEEE

Year: 2014

Efficient host based intrusion detection system using Partial Decision Tree and Correlation feature selection algorithm

Type: Conference Paper

Author : Lydia Catherine, F.; Pathak, Ravi; Vaidehi, V.

Publisher: IEEE

Year: 2014

Robust testing for stationarity in the presence of outliers

Type: Conference Paper

Author : Dagdagan, J. , Muma, M. , Zoubir, A.M.

Publisher: IEEE

Year: 2014

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Enhancement in IEEE 1500 standard for at-speed test and debug

Eddy Current Loss Estimation of Edge Burr-Affected Magnetic Laminations Based on Equivalent Electrical Network—Part I: Fundamental Concepts and FEM Modeling

Improved Supercapacitor Floating Ageing Interpretation Through Multipore Impedance Model Parameters Evolution

Equivalent Electrical Model and Software Tool for SPICE-Compatible Thermal Simulations of High-Power Resistors

Fragmental Frequency Analysis Method to Estimate Electrical Cell Parameters From Bioimpedance Study

Gene expression profiling by estimating parameters of gene regulatory network using simulated annealing: A comparative study

A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14µA sleep current using Reverse Body Bias Assisted 65nm SOTB CMOS technology

A novel design and characterization for 67GHz NLTL-based harmonic phase reference

Efficient host based intrusion detection system using Partial Decision Tree and Correlation feature selection algorithm

Robust testing for stationarity in the presence of outliers

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Enhancement in IEEE 1500 standard for at-speed test and debug

Eddy Current Loss Estimation of Edge Burr-Affected Magnetic Laminations Based on Equivalent Electrical Network&#x2014;Part I: Fundamental Concepts and FEM Modeling

Improved Supercapacitor Floating Ageing Interpretation Through Multipore Impedance Model Parameters Evolution

Equivalent Electrical Model and Software Tool for SPICE-Compatible Thermal Simulations of High-Power Resistors

Fragmental Frequency Analysis Method to Estimate Electrical Cell Parameters From Bioimpedance Study

Gene expression profiling by estimating parameters of gene regulatory network using simulated annealing: A comparative study

A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14&#x00B5;A sleep current using Reverse Body Bias Assisted 65nm SOTB CMOS technology

A novel design and characterization for 67GHz NLTL-based harmonic phase reference

Efficient host based intrusion detection system using Partial Decision Tree and Correlation feature selection algorithm

Robust testing for stationarity in the presence of outliers

Eddy Current Loss Estimation of Edge Burr-Affected Magnetic Laminations Based on Equivalent Electrical Network—Part I: Fundamental Concepts and FEM Modeling

A Perpetuum Mobile 32bit CPU with 13.4pJ/cycle, 0.14µA sleep current using Reverse Body Bias Assisted 65nm SOTB CMOS technology