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    In Situ Surface Voltage Measurements of Dielectrics Under Electron Beam Irradiation 

    Type: Journal Paper
    Author : Hodges, Joshua L.; Dennison, J.R.; Dekany, Justin; Wilson, G.; Evans, Adrian; Sim, Alec M.
    Publisher: IEEE
    Year: 2014

    Tethered Interference Cancellation: Military versus full-duplex applications and comparisons 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    A case study on travel information from social network — Focus in Facebook and blogs in Malaysia 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    A new strategy for restraining seismic response of highway bridges 

    Type: Conference Paper
    Author : Ma Yong-Quan; Qiu Hong-Xing
    Publisher: IEEE
    Year: 2014

    Signal processing for animal behavior detection 

    Type: Conference Paper
    Author : Usher, Colin T.; Daley, Wayne; Webster, Bruce; Ritz, Casey
    Publisher: IEEE
    Year: 2014

    Spectroscopy and Topography of Deep-Level Luminescence in Photovoltaic Silicon 

    Type: Journal Paper
    Author : Tajima, Michio
    Publisher: IEEE
    Year: 2014

    Analysis of Radiation Effects in Silicon Using Kinetic Monte Carlo Methods 

    Type: Journal Paper
    Author : Hehr, Brian D.
    Publisher: IEEE
    Year: 2014

    Strain Effects on Radiation Tolerance of Triple-Junction Solar Cells With InAs Quantum Dots in the GaAs Junction 

    Type: Journal Paper
    Author : Kerestes, Chris; Cress, Cory D.; Richards, B.C.; Forbes, David V.; Yong Lin; Bittner, Zachary; Polly, Stephen J.; Sharps, Paul; Hubbard, Seth M.
    Publisher: IEEE
    Year: 2014

    MogaMap and DynPack: Multi-Objective mapping and packing algorithms for optimization of area, performance and power consumption in FPGAs 

    Type: Conference Paper
    Author : Souza, V.L.; Silva-Filho, A.G.
    Publisher: IEEE
    Year: 2014

    FLEXOR: A modular wireless network tool for WBAN systems 

    Type: Conference Paper
    Author : Barrera, Andres Alejandro; Gutierrez, Manuel Enrique; Rodriguez Paez, Juan S.; Fajardo, Arturo
    Publisher: IEEE
    Year: 2014
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