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Now showing items 1-10 of 24

Negotiation based project risk management framework

Type: Conference Paper

Publisher: IEEE

Year: 2014

Enhancement in IEEE 1500 standard for at-speed test and debug

Type: Conference Paper

Author : Ali, Ghazanfar; Hussin, Fawnizu Azmadi; Zain Ali, Noohul Basheer; Hamid, Nor Hisham; Adnan, Raja Mahmud

Publisher: IEEE

Year: 2014

Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments

Type: Journal Paper

Author : Giaffreda, Daniele; Magnone, Paolo; Meneghini, Matteo; Barbato, Marco; Meneghesso, Gaudenzio; Zanoni, Enrico; Sangiorgi, Enrico; Fiegna, Claudio

Publisher: IEEE

Year: 2014

Optical and Electrical Simulation of μc-Si:H Solar Cells: Effect of Substrate Morphology and Crystalline Fraction

Type: Journal Paper

Author : Do Yun Kim; van Swaaij, Rene /A/. C. M. M.; Zeman, M.

Publisher: IEEE

Year: 2014

Civil information integration and interoperability

Type: Conference Paper

Author : Christman, Gerard J.; Fila, Brian D.

Publisher: IEEE

Year: 2014

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Type: Journal Paper

Author : Azevedo, Joao; Virazel, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, Aida; Alvarez-Herault, Jeremy; Mackay, Ken

Publisher: IEEE

Year: 2014

Robust Compact Model for Bipolar Oxide-Based Resistive Switching Memories

Type: Journal Paper

Author : Bocquet, Michael; Deleruyelle, D.; Aziza, H.; Muller, Candice; Portal, J.-M.; Cabout, Thomas; Jalaguier, E.

Publisher: IEEE

Year: 2014

Debug Automation for Synchronization Bugs at RTL

Type: Conference Paper

Author : Dehbashi, M. , Fey, G.

Year: 2014

Directed-Hypergraph Based E-Learning Process Modeling Supporting Dynamic-Personalized-Combined Resource Optimization

Type: Conference Paper

Author : Sun, Xuedong; Li, Zhonghua; Hu, Shicheng

Publisher: IEEE

Year: 2014

Publisher's Information-Volume 1

Type: Conference Paper

Publisher: IEEE

Year: 2014

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Negotiation based project risk management framework

Enhancement in IEEE 1500 standard for at-speed test and debug

Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments

Optical and Electrical Simulation of μc-Si:H Solar Cells: Effect of Substrate Morphology and Crystalline Fraction

Civil information integration and interoperability

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Robust Compact Model for Bipolar Oxide-Based Resistive Switching Memories

Debug Automation for Synchronization Bugs at RTL

Directed-Hypergraph Based E-Learning Process Modeling Supporting Dynamic-Personalized-Combined Resource Optimization

Publisher's Information-Volume 1

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Negotiation based project risk management framework

Enhancement in IEEE 1500 standard for at-speed test and debug

Local Shunting in Multicrystalline Silicon Solar Cells: Distributed Electrical Simulations and Experiments

Optical and Electrical Simulation of &#x03BC;c-Si:H Solar Cells: Effect of Substrate Morphology and Crystalline Fraction

Civil information integration and interoperability

A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs

Robust Compact Model for Bipolar Oxide-Based Resistive Switching Memories

Debug Automation for Synchronization Bugs at RTL

Directed-Hypergraph Based E-Learning Process Modeling Supporting Dynamic-Personalized-Combined Resource Optimization

Publisher's Information-Volume 1

Optical and Electrical Simulation of μc-Si:H Solar Cells: Effect of Substrate Morphology and Crystalline Fraction