Search

Now showing items 1-10 of 83

Advanced CMOS reliability challenges

Type: Conference Paper

Author : Prasad, C.

Publisher: IEEE

Year: 2014

Novel single-electron information-processing circuits mimicking behavior of ant groups

Type: Conference Paper

Author : Obi, Y. , Oya, T.

Publisher: IEEE

Year: 2014

On the mechanisms of dangerous sea level rise in the eastern part gulf of Finland and possible reasons for the increase in their frequency in the second half of XX and the beginning of the XXI century

Type: Conference Paper

Publisher: IEEE

Year: 2014

Supply chain cost reduction by implementing integrated activity based costing and data envelopment analysis: A case study

Type: Conference Paper

Author : Yanpirat, P. , Choatheitmanut, A.

Publisher: IEEE

Year: 2014

Bi-Modal DRAM Cache: Improving Hit Rate, Hit Latency and Bandwidth

Type: Conference Paper

Author : Gulur, N.; Mehendale, M.; Manikantan, R.; Govindarajan, R.

Publisher: IEEE

Year: 2014

Stability Analysis of a Hierarchical Architecture for Discrete-Time Sensor-Based Control of Robotic Systems

Type: Journal Paper

Author : Bjerkeng, Magnus; Falco, Pietro; Natale, Ciro; Pettersen, Kristin Y.

Publisher: IEEE

Year: 2014

OpenFlow-based control architecture for the mobile FreeSpace optical networks

Type: Journal Paper

Author : Zhao Yongli; Gao Lingnan; Yin Xingbin; Yu Yue; Zhang Jie

Publisher: IEEE

Year: 2014

Development of a Guaranteed Stable Network of Telerobots with Kinesthetic Consensus

Type: Journal Paper

Author : Razi, Kamran; Hashtrudi-Zaad, Keyvan

Publisher: IEEE

Year: 2014

Navigation of Magnetic Microrobots With Different User Interaction Levels

Type: Journal Paper

Author : Lucarini, Gioia; Palagi, Stefano; Levi, Alessandro; Mazzolai, Barbara; Dario, P.; Menciassi, A.; Beccai, Lucia

Publisher: IEEE

Year: 2014

Improvement in elecrical properties in SAB-based n+-Si/n-4H-SiC junctions by annealing

Type: Conference Paper

Publisher: IEEE

Year: 2014

1
2
3
4
. . .
9

Search

Advanced CMOS reliability challenges

Novel single-electron information-processing circuits mimicking behavior of ant groups

On the mechanisms of dangerous sea level rise in the eastern part gulf of Finland and possible reasons for the increase in their frequency in the second half of XX and the beginning of the XXI century

Supply chain cost reduction by implementing integrated activity based costing and data envelopment analysis: A case study

Bi-Modal DRAM Cache: Improving Hit Rate, Hit Latency and Bandwidth

Stability Analysis of a Hierarchical Architecture for Discrete-Time Sensor-Based Control of Robotic Systems

OpenFlow-based control architecture for the mobile FreeSpace optical networks

Development of a Guaranteed Stable Network of Telerobots with Kinesthetic Consensus

Navigation of Magnetic Microrobots With Different User Interaction Levels

Improvement in elecrical properties in SAB-based n+-Si/n-4H-SiC junctions by annealing

Author

Publisher

Year

Keywords

Type

Language (ISO)

Content Type

Publication Title

Search

Filters

Advanced CMOS reliability challenges

Novel single-electron information-processing circuits mimicking behavior of ant groups

On the mechanisms of dangerous sea level rise in the eastern part gulf of Finland and possible reasons for the increase in their frequency in the second half of XX and the beginning of the XXI century

Supply chain cost reduction by implementing integrated activity based costing and data envelopment analysis: A case study

Bi-Modal DRAM Cache: Improving Hit Rate, Hit Latency and Bandwidth

Stability Analysis of a Hierarchical Architecture for Discrete-Time Sensor-Based Control of Robotic Systems

OpenFlow-based control architecture for the mobile FreeSpace optical networks

Development of a Guaranteed Stable Network of Telerobots with Kinesthetic Consensus

Navigation of Magnetic Microrobots With Different User Interaction Levels

Improvement in elecrical properties in SAB-based n&#x002B;-Si/n-4H-SiC junctions by annealing

Improvement in elecrical properties in SAB-based n+-Si/n-4H-SiC junctions by annealing