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A design method of delta-sigma data conversion system with pre-filter

Type: Conference Paper

Author : Okajima, H.; Honda, M.; Yoshino, R.; Matsunaga, N.

Publisher: IEEE

Year: 2014

Investigation of Random Telegraph Noise in the Dark Current of Germanium Waveguide Photodetector

Type: Journal Paper

Author : Zhijuan Tu; Zhiping Zhou; Xingjun Wang

Publisher: IEEE

Year: 2014

Impact of Sampling Rate on RTN Time Constant Extraction and Its Implications on Bias Dependence and Trap Spectroscopy

Type: Journal Paper

Author : Kapila, Gautam; Reddy, Veerababu

Publisher: IEEE

Year: 2014

Conference Committees

Type: Conference Paper

Publisher: IEEE

Year: 2014

Fast Ramped Voltage Characterization of Single Trap Bias and Temperature Impact on Time-Dependent <inline-formula> <img src="/images/tex/18637.gif" alt="V_{\\rm TH}"> </inline-formula> Variability

Type: Journal Paper

Author : Toledano-Luque, Maria; Degraeve, Robin; Roussel, P.J.; Ragnarsson, Lars-Ake; Chiarella, T.; Horiguchi, Naoto; Mocuta, Anda; Thean, A.

Publisher: IEEE

Year: 2014

Assessment of the Impact of Inelastic Tunneling on the Frequency-Depth Conversion from Low-Frequency Noise Spectra

Type: Journal Paper

Author : Simoen, Eddy; Jae Woo Lee; Claeys, Cor

Publisher: IEEE

Year: 2014

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A design method of delta-sigma data conversion system with pre-filter

Investigation of Random Telegraph Noise in the Dark Current of Germanium Waveguide Photodetector

Impact of Sampling Rate on RTN Time Constant Extraction and Its Implications on Bias Dependence and Trap Spectroscopy

Conference Committees

Fast Ramped Voltage Characterization of Single Trap Bias and Temperature Impact on Time-Dependent <inline-formula> <img src="/images/tex/18637.gif" alt="V_{\\rm TH}"> </inline-formula> Variability

Assessment of the Impact of Inelastic Tunneling on the Frequency-Depth Conversion from Low-Frequency Noise Spectra

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A design method of delta-sigma data conversion system with pre-filter

Investigation of Random Telegraph Noise in the Dark Current of Germanium Waveguide Photodetector

Impact of Sampling Rate on RTN Time Constant Extraction and Its Implications on Bias Dependence and Trap Spectroscopy

Conference Committees

Fast Ramped Voltage Characterization of Single Trap Bias and Temperature Impact on Time-Dependent <inline-formula> <img src="/images/tex/18637.gif" alt="V_{\\rm TH}"> </inline-formula> Variability

Assessment of the Impact of Inelastic Tunneling on the Frequency-Depth Conversion from Low-Frequency Noise Spectra