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Parameters influencing the maximum controllable current in gate commutated thyristors

Type: Journal Paper

Author : Lophitis, N.; Antoniou, M.; Udrea, F.; Nistor, I.; Arnold, Martin; Wikströ m, Tobias; Vobecky, J.

Publisher: IET

Year: 2014

Integrated Powder-Based Thick Films for Thermoelectric, Pyroelectric, and Piezoelectric Energy Harvesting Devices

Type: Journal Paper

Author : Dorey, Robert /A/.

Publisher: IEEE

Year: 2014

Design Modifications to Improve the Antishock Performance of a Stamped Base for a 2.5-in HDD

Type: Journal Paper

Author : Geonyup Lim; Seokhwan Kim; No-Cheol Park; Kyoung-Su Park; Hyun-Chul Lee; Ju-Ho Kim

Publisher: IEEE

Year: 2014

Classification and authentication of one-dimensional behavioral biometrics

Type: Conference Paper

Author : Monaco, John V.

Publisher: IEEE

Year: 2014

Quality of fingerprint scans captured using Optical Coherence Tomography

Type: Conference Paper

Author : Sousedik, Ctirad; Busch, Christoph

Publisher: IEEE

Year: 2014

Author

Antoniou, M. (1)

Arnold, Martin (1)

Busch, Christoph (1)

Dorey, Robert /A/. (1)

Geonyup Lim (1)

Hyun-Chul Lee (1)

Ju-Ho Kim (1)

Kyoung-Su Park (1)

Lophitis, N. (1)

m, Tobias (1)

Publisher

IEEE (4)

IET (1)

Year

2014 (5)

Keywords

III-V semiconductors (2)

n base thickness (2)

n gallium compounds (2)

n hot electron transistors (2)

n wide band gap semiconductors (2)

Analytical models (1)

antishock performance (1)

base thickness (1)

buffer peak concentration (1)

Correlation (1)

Type

Journal Paper (3)

Conference Paper (2)

Language (ISO)

English (5)

Content Type

Metadata Only (5)

Publication Title

iometrics (IJCB), 2014 IEEE International Joint Conference on (2)

Circuits, Devices &amp; Systems, IET (1)

Magnetics, IEEE Transactions on (1)

Sensors Journal, IEEE (1)

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