In this paper, the high frequency analysis of a non-contact atomic force microscopy microcantilever

has been discussed. In modeling and simulation of micro-cantilever in previous investigations, mass and moment of ...

We have prepared a grooved indium tin oxide ~ITO! surface with groove widths of ;40–90 nm and

a variable groove separation up to 36 mm using atomic force microscopy nanolithography. Twisted

nematic pixels ...

A novel nonlinear fractional order sliding mode controller is proposed to control the chaotic atomic force microscope system in presence of uncertainties and disturbances. In the design of the suggested fractional order controller, conformable...