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    Effects of Rotating Bending Fatigue of CK45 Stell Test Specimens on Yield Strength, Elongation and Area Reduction 

    Type: Conference Paper
    Author : خلیل فرهنگ دوست; Khalil Farhangdoost
    Year: 2008
    Abstract:

    , percentage of area reduction and the percentage of elongation is determined for any specimen. The results are then compared with the data obtained for a virgin specimen (the specimen on which no fatigue test is done and the tensile test is carried out...

    Sensor Localization via Diversely Polarized Antennas 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Reactive Impedance Surface TM Mode Slow Wave for Patch Antenna Miniaturization [AMTA Corner] 

    Type: Journal Paper
    Author : Jiangfeng Wu; Sarabandi, Kamal
    Publisher: IEEE
    Year: 2014

    PaCC: A Parallel Compare and Compress Codec for Area Reduction in Nonvolatile Processors 

    Type: Journal Paper
    Author : Yiqun Wang; Yongpan Liu; Shuangchen Li; Xiao Sheng; Daming Zhang; Mei-Fang Chiang; Baiko Sai; Hu, Xiaobo Sharon; Huazhong Yang
    Publisher: IEEE
    Year: 2014

    Gate Mapping Automation for Asynchronous NULL Convention Logic Circuits 

    Type: Journal Paper
    Author : Parsan, F.A.; Al-Assadi, Waleed K.; Smith, Scott C.
    Publisher: IEEE
    Year: 2014

    A BIRA for Memories With an Optimal Repair Rate Using Spare Memories for Area Reduction 

    Type: Journal Paper
    Author : Wooheon Kang; Hyungjun Cho; Joohwan Lee; Sungho Kang
    Publisher: IEEE
    Year: 2014

    Tiny - optimised 3D mesh NoC for area and latency minimisation 

    Type: Journal Paper
    Author : Marcon, Cesar; Webber, Thais; Fernandes, R.; Cataldo, Robert; Grando, Fernando; Poehls, L.; Benso, Alfredo
    Publisher: IET
    Year: 2014

    Identifying risky areas of software code in Agile/Lean software development: An industrial experience report 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Considerations for the implementation of test access points a best practice guide 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Multicriteria decision examination in wireless sensor networks 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014
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