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Adaptive Generalized Likelihood Ratio Chart for Monitoring the Process Mean

Type: Conference Paper

Author : REZA, SHOKRIZADEH; ABBAS, SAGHAEI; VAHID, AMIRZADEH

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The variable parameters T 2 chart with run rules

Type: Journal Paper

Publisher: Springer

Year: 2014

A Reputation System Resisting to Undercover Marketing

Type: Conference Paper

Author : Sato, Fumiaki

Publisher: IEEE

Year: 2014

Simultaneous acquisition of high-rate early, middle, and late auditory evoked potentials

Type: Conference Paper

Author : Holt, F.D.; Ozdamar, O.

Publisher: IEEE

Year: 2014

Cost and yield analysis of multi-die packaging using 2.5D technology compared to fan-out wafer level packaging

Type: Conference Paper

Author : Palesko, Chet; Palesko, Amy; Vardaman, E.Jan

Publisher: IEEE

Year: 2014

Peening surface integrity of different milling conditions for high strength aluminum alloy 7055

Type: Conference Paper

Author : Changfeng Yao , Yongxia Du

Publisher: IEEE

Year: 2014

To the Point: A Shortcut to Essential Learning

Type: Conference Paper

Author : Kawase, R. , Siehndel, P. , Pereira Nunes, B.

Publisher: IEEE

Year: 2014

Interference aware massive SDMA with a large uniform rectangular antenna array

Type: Conference Paper

Author : Kurras, M. , Thiele, L. , Haustein, T.

Publisher: IEEE

Year: 2014

Poster: Comparison of RAN technologies for delay-tolerant downloads in vehicular networks

Type: Conference Paper

Author : Riihijarvi, J.; Lambrechts, S.; Mahonen, P.

Publisher: IEEE

Year: 2014

Accountable Health Care Service Provisioning in the Cloud

Type: Conference Paper

Author : Bernsmed, Karin

Publisher: IEEE

Year: 2014

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Adaptive Generalized Likelihood Ratio Chart for Monitoring the Process Mean

The variable parameters T 2 chart with run rules

A Reputation System Resisting to Undercover Marketing

Simultaneous acquisition of high-rate early, middle, and late auditory evoked potentials

Cost and yield analysis of multi-die packaging using 2.5D technology compared to fan-out wafer level packaging

Peening surface integrity of different milling conditions for high strength aluminum alloy 7055

To the Point: A Shortcut to Essential Learning

Interference aware massive SDMA with a large uniform rectangular antenna array

Poster: Comparison of RAN technologies for delay-tolerant downloads in vehicular networks

Accountable Health Care Service Provisioning in the Cloud

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Adaptive Generalized Likelihood Ratio Chart for Monitoring the Process Mean

The variable parameters T 2 chart with run rules

A Reputation System Resisting to Undercover Marketing

Simultaneous acquisition of high-rate early, middle, and late auditory evoked potentials

Cost and yield analysis of multi-die packaging using 2.5D technology compared to fan-out wafer level packaging

Peening surface integrity of different milling conditions for high strength aluminum alloy 7055

To the Point: A Shortcut to Essential Learning

Interference aware massive SDMA with a large uniform rectangular antenna array

Poster: Comparison of RAN technologies for delay-tolerant downloads in vehicular networks

Accountable Health Care Service Provisioning in the Cloud