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Now showing items 1-10 of 11

Passive UWB multiplexing device for a single-port MIMO RADAR

Type: Conference Paper

Author : Fromenteze, T. , Decroze, C. , Carsenat, D.

Publisher: IEEE

Year: 2014

Data-driven local planning at national scale: How data collected on mobile phones enable a Conditional Grants Scheme in Nigeria

Type: Conference Paper

Author : Pokharel, Prabhas; Gleitsmann, Brett; Chafik, Salah; Heberer, Candice; Ma, Myf; Tan, Chris; Zaiming Yao; Modi, Vijay

Publisher: IEEE

Year: 2014

Runtime Adaptation for Autonomic Heterogeneous Computing

Type: Conference Paper

Author : Scogland, T.R.W. , Wu-Chun Feng

Publisher: IEEE

Year: 2014

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Type: Journal Paper

Author : Roig, Fabien; Dusseau, L.; Ribeiro, P.; Auriel, G.; Roche, Nicholas J.-H; Privat, A.; Vaille, J.-R.; Boch, J.; Saigne, F.; Marec, R.; Calvel, P.; Bezerra, F.; Ecoffet, R.; Azais, Bruno

Publisher: IEEE

Year: 2014

Total Ionizing Dose Effects Mitigation Strategy for Nanoscaled FDSOI Technologies

Type: Journal Paper

Author : Gaillardin, M.; Martinez, Manuel; Paillet, P.; Raine, M.; Andrieu, F.; Faynot, O.; Thomas, O.

Publisher: IEEE

Year: 2014

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Type: Journal Paper

Author : Joon-Bae Moon; Dong-Il Moon; Yang-Kyu Choi

Publisher: IEEE

Year: 2014

Robotic arm movement using color detection with FPGA vision

Type: Conference Paper

Author : Szabo, Roland; Gontean, Aurel

Publisher: IEEE

Year: 2014

Secure and time efficient hash-based message authentication algorithm for wireless sensor networks

Type: Conference Paper

Author : Al-Mashhadi, Haider M.; Abdul-Wahab, Hala B.; Hassan, Rehab F.

Publisher: IEEE

Year: 2014

Handwritten objects recognition using Regularized Logistic Regression and feedforward Neural Networks

Type: Conference Paper

Author : Shabani, Shaham; Norouzi, Yaser; Fariborz, Marjan

Publisher: IEEE

Year: 2014

Impact of Total Ionizing Dose on a 4th Generation, 90 nm SiGe HBT Gaussian Pulse Generator

Type: Journal Paper

Author : Inanlou, Farzad; Lourenco, Nelson E.; Fleetwood, Zachary E.; Ickhyun Song; Howard, Duane C.; Cardoso, Alberto; Zeinolabedinzadeh, Saeed; Zhang, Enxia; Zhang, C.X.; Paki-Amouzou, Pauline; Cressler, John D.

Publisher: IEEE

Year: 2014

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Passive UWB multiplexing device for a single-port MIMO RADAR

Data-driven local planning at national scale: How data collected on mobile phones enable a Conditional Grants Scheme in Nigeria

Runtime Adaptation for Autonomic Heterogeneous Computing

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Total Ionizing Dose Effects Mitigation Strategy for Nanoscaled FDSOI Technologies

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Robotic arm movement using color detection with FPGA vision

Secure and time efficient hash-based message authentication algorithm for wireless sensor networks

Handwritten objects recognition using Regularized Logistic Regression and feedforward Neural Networks

Impact of Total Ionizing Dose on a 4th Generation, 90 nm SiGe HBT Gaussian Pulse Generator

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Passive UWB multiplexing device for a single-port MIMO RADAR

Data-driven local planning at national scale: How data collected on mobile phones enable a Conditional Grants Scheme in Nigeria

Runtime Adaptation for Autonomic Heterogeneous Computing

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Total Ionizing Dose Effects Mitigation Strategy for Nanoscaled FDSOI Technologies

Influence of Total Ionizing Dose on Sub-100&#x00A0;nm Gate-All-Around MOSFETs

Robotic arm movement using color detection with FPGA vision

Secure and time efficient hash-based message authentication algorithm for wireless sensor networks

Handwritten objects recognition using Regularized Logistic Regression and feedforward Neural Networks

Impact of Total Ionizing Dose on a 4th Generation, 90&#x00A0;nm SiGe HBT Gaussian Pulse Generator

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Impact of Total Ionizing Dose on a 4th Generation, 90 nm SiGe HBT Gaussian Pulse Generator