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On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors

Type: Journal Paper

Author : Sabena, D.; Reorda, M. Sonza; Sterpone, L.

Publisher: IEEE

Year: 2014

E<sup>2</sup>MD for reduction of motion artifacts from photoplethysmographic signals

Type: Conference Paper

Author : Raghuram, M. , Sivani, K. , Reddy, K.A.

Publisher: IEEE

Year: 2014

Author

Raghuram, M. , Sivani, K. , Reddy, K.A. (1)

Reorda, M. Sonza (1)

Sabena, D. (1)

Sterpone, L. (1)

Publisher

IEEE (2)

Year

2014 (2)

Keywords

microprocessor chips (2)

automatic testing (1)

decode unit (1)

decode units (1)

electronic engineering computing (1)

embedded signal processing applications (1)

embedded systems (1)

Encoding (1)

fault diagnosis (1)

fault grading (1)

Type

Conference Paper (1)

Journal Paper (1)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

lectronics and Communication Systems (ICECS), 2014 International Conference on (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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