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    Gate-Bias Stress Stability of P-Type SnO Thin-Film Transistors Fabricated by RF-Sputtering 

    Type: Journal Paper
    Author : I-Chung Chiu; I-Chun Cheng
    Publisher: IEEE
    Year: 2014

    Executive Committee 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Influence of Mechanical Bending on Flexible InGaZnO-Based Ferroelectric Memory TFTs 

    Type: Journal Paper
    Author : Petti, L.; Munzenrieder, N.; Salvatore, G.A.; Zysset, Christoph; Kinkeldei, Thomas; Buthe, L.; Troster, G.
    Publisher: IEEE
    Year: 2014

    Improved Switching Voltage Variation of Cu Atom Switch for Nonvolatile Programmable Logic 

    Type: Journal Paper
    Author : Banno, N.; Tada, Mitsunori; Sakamoto, Takanori; Okamoto, K.; Miyamura, Makoto; Iguchi, Noriyuki; Hada, Hiromitsu
    Publisher: IEEE
    Year: 2014

    Instability Induced by Ultraviolet Light in ZnO Thin-Film Transistors 

    Type: Journal Paper
    Author : Ping Wu; Jie Zhang; Jianguo Lu; Xifeng Li; Chuanjia Wu; Rujie Sun; Lisha Feng; Qingjun Jiang; Bin Lu; Xinhua Pan; Zhizhen Ye
    Publisher: IEEE
    Year: 2014

    Investigation of Static and Dynamic Characteristics of Optically Controlled Field Effect Transistors 

    Type: Journal Paper
    Author : Colace, Lorenzo; Sorianello, V.; Ramajani, Saravanan
    Publisher: IEEE
    Year: 2014

    Impact of Contact Placement on Subthreshold Characteristics of Organic Thin-Film Transistors 

    Type: Journal Paper
    Author : Islam, M.N.; Mazhari, B.
    Publisher: IEEE
    Year: 2014

    The opportunity and challenge of Big Data's application in distribution grids 

    Type: Conference Paper
    Author : Miao, Xin; Zhang, Dongxia
    Publisher: IEEE
    Year: 2014

    Research on IEC 61968 based message design for intelligent operation and maintenance center 

    Type: Conference Paper
    Author : Yu, Nanhua; Chen, Hui; Song, Xudong; Sun, Chen; Liu, Dong; Liu, Yingxu
    Publisher: IEEE
    Year: 2014

    Classificação de áreas na indústria do petróleo e gás 

    Type: Conference Paper
    Author : Rangel, Estellito
    Publisher: IEEE
    Year: 2014
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