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Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

Type: Journal Paper

Author : Kumari, Vandana; Saxena, Manoj; Gupta, R.S.; Gupta, Madhu

Publisher: IEEE

Year: 2014

Analysis of Correlated Gate and Drain Random Telegraph Noise in Post-Soft Breakdown TiN/HfLaO/<formula formulatype="inline"> <img src="/images/tex/20585.gif" alt="{\\rm SiO}_{x}"> </formula> nMOSFETs

Type: Journal Paper

Author : Wenhu Liu; Padovani, A.; Larcher, Luca; Raghavan, N.; Kin Leong Pey

Publisher: IEEE

Year: 2014

Parallel Processing and Intercommunication of Multiple Negotiation Processes in E-Commerce for Optimal Business

Type: Conference Paper

Author : Hussain, M.J.

Publisher: IEEE

Year: 2014

PUF Interfaces and their Security

Type: Conference Paper

Author : Van Dijk, M. , Ruhrmair, U.

Publisher: IEEE

Year: 2014

Uniform Selection of Vertices for Watermark Embedding in 3-D Polygon Mesh Using IEEE754 Floating Point Representation

Type: Conference Paper

Publisher: IEEE

Year: 2014

Mode perturbations of a ring resonator for wideband and multiband filters

Type: Conference Paper

Author : Sheng Sun; Lei Zhu

Publisher: IEEE

Year: 2014

Comparative analysis of motion estimation algorithms on slow, medium and fast video sequences

Type: Conference Paper

Author : Arora, S.M. , Rajpal, N.

Publisher: IEEE

Year: 2014

Energy efficient mobile vision system for plant leaf disease identification

Type: Conference Paper

Author : Prasad, Shitala; Peddoju, Sateesh K.; Ghosh, D.

Publisher: IEEE

Year: 2014

Sampling large data on graphs

Type: Conference Paper

Author : Shomorony, Han; Avestimehr, A.Salman

Publisher: IEEE

Year: 2014

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor

Type: Journal Paper

Author : Weifeng Sun; Chunwei Zhang; Siyang Liu; Tingting Huang; Chaohui Yu; Wei Su; Aijun Zhang; Yuwei Liu; Xiaowei He; Xingwen Wu

Publisher: IEEE

Year: 2014

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Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

Analysis of Correlated Gate and Drain Random Telegraph Noise in Post-Soft Breakdown TiN/HfLaO/<formula formulatype="inline"> <img src="/images/tex/20585.gif" alt="{\\rm SiO}_{x}"> </formula> nMOSFETs

Parallel Processing and Intercommunication of Multiple Negotiation Processes in E-Commerce for Optimal Business

PUF Interfaces and their Security

Uniform Selection of Vertices for Watermark Embedding in 3-D Polygon Mesh Using IEEE754 Floating Point Representation

Mode perturbations of a ring resonator for wideband and multiband filters

Comparative analysis of motion estimation algorithms on slow, medium and fast video sequences

Energy efficient mobile vision system for plant leaf disease identification

Sampling large data on graphs

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor

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Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability

Analysis of Correlated Gate and Drain Random Telegraph Noise in Post-Soft Breakdown TiN/HfLaO/<formula formulatype="inline"> <img src="/images/tex/20585.gif" alt="{\\rm SiO}_{x}"> </formula> nMOSFETs

Parallel Processing and Intercommunication of Multiple Negotiation Processes in E-Commerce for Optimal Business

PUF Interfaces and their Security

Uniform Selection of Vertices for Watermark Embedding in 3-D Polygon Mesh Using IEEE754 Floating Point Representation

Mode perturbations of a ring resonator for wideband and multiband filters

Comparative analysis of motion estimation algorithms on slow, medium and fast video sequences

Energy efficient mobile vision system for plant leaf disease identification

Sampling large data on graphs

Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor