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    Investigation of Electrostatic Integrity of Nanoscale Dual Material Gate Dielectric Pocket Silicon-on-Void (DMGDPSOV) MOSFET for Improved Device Scalability 

    Type: Journal Paper
    Author : Kumari, Vandana; Saxena, Manoj; Gupta, R.S.; Gupta, Madhu
    Publisher: IEEE
    Year: 2014

    Analysis of Correlated Gate and Drain Random Telegraph Noise in Post-Soft Breakdown TiN/HfLaO/<formula formulatype="inline"> <img src="/images/tex/20585.gif" alt="{\\rm SiO}_{x}"> </formula> nMOSFETs 

    Type: Journal Paper
    Author : Wenhu Liu; Padovani, A.; Larcher, Luca; Raghavan, N.; Kin Leong Pey
    Publisher: IEEE
    Year: 2014

    Parallel Processing and Intercommunication of Multiple Negotiation Processes in E-Commerce for Optimal Business 

    Type: Conference Paper
    Author : Hussain, M.J.
    Publisher: IEEE
    Year: 2014

    PUF Interfaces and their Security 

    Type: Conference Paper
    Author : Van Dijk, M. , Ruhrmair, U.
    Publisher: IEEE
    Year: 2014

    Uniform Selection of Vertices for Watermark Embedding in 3-D Polygon Mesh Using IEEE754 Floating Point Representation 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Mode perturbations of a ring resonator for wideband and multiband filters 

    Type: Conference Paper
    Author : Sheng Sun; Lei Zhu
    Publisher: IEEE
    Year: 2014

    Comparative analysis of motion estimation algorithms on slow, medium and fast video sequences 

    Type: Conference Paper
    Author : Arora, S.M. , Rajpal, N.
    Publisher: IEEE
    Year: 2014

    Energy efficient mobile vision system for plant leaf disease identification 

    Type: Conference Paper
    Author : Prasad, Shitala; Peddoju, Sateesh K.; Ghosh, D.
    Publisher: IEEE
    Year: 2014

    Sampling large data on graphs 

    Type: Conference Paper
    Author : Shomorony, Han; Avestimehr, A.Salman
    Publisher: IEEE
    Year: 2014

    Hot-Carrier-Induced Forward and Reverse Saturation Current Degradations for the n-Type Symmetric EDMOS Transistor 

    Type: Journal Paper
    Author : Weifeng Sun; Chunwei Zhang; Siyang Liu; Tingting Huang; Chaohui Yu; Wei Su; Aijun Zhang; Yuwei Liu; Xiaowei He; Xingwen Wu
    Publisher: IEEE
    Year: 2014
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