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A comprehensive review on the quasi induced exposure technique

Type: Journal Paper

Author : Jiang, Xinguo - Lyles, Richard W. - Guo, Runhua

Publisher: Elsevier Science

Year: 2014

Analysis of the topography and the sub-surface damage of Cz- and mc-silicon wafers sawn with diamond wire

Type: Conference Paper

Author : Buchwald, R.; Wurzner, S.; Frohlich, K.; Fuchs, M.; Retsch, S.; Lehmann, T.; Moller, H.J.

Publisher: IEEE

Year: 2014

The model of choice between preferences: Elevator-stairs dilemma

Type: Conference Paper

Author : Botton, Rottem

Publisher: IEEE

Year: 2014

Author

Botton, Rottem (1)

Buchwald, R. (1)

Frohlich, K. (1)

Fuchs, M. (1)

Jiang, Xinguo - Lyles, Richard W. - Guo, Runhua (1)

Lehmann, T. (1)

Moller, H.J. (1)

Retsch, S. (1)

Wurzner, S. (1)

Publisher

IEEE (2)

Elsevier Science (1)

Year

2014 (3)

Keywords

down conversion (1)

electric field measurement (1)

electromagnetic field exposure measurement (1)

exposimeter (1)

exposure (1)

Exposure measurements (1)

frequency 700 MHz to 6 GHz (1)

magnetic field measurement (1)

measurements (1)

microwave measurement (1)

Type

Conference Paper (2)

Journal Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

Accident Analysis & Prevention (1)

hotovoltaic Specialist Conference (PVSC), 2014 IEEE 40th (1)

lectrical &amp; Electronics Engineers in Israel (IEEEI), 2014 IEEE 28th Convention of (1)

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