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    Long line distance protection based on fast phasor calculation algorithm 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    On-chip intelligence: A pathway to self-testable, tunable, and trusted analog/RF ICs 

    Type: Conference Paper
    Author : Maliuk, Dzmitry , Makris, Yiorgos
    Publisher: IEEE
    Year: 2014

    A novel VSC HVDC active power control strategy to improve AC system stability 

    Type: Conference Paper
    Author : Alamuti, M.M.; Saunders, C.S.; Taylor, G.A.
    Publisher: IEEE
    Year: 2014

    Content Caching and Scheduling in Wireless Networks With Elastic and Inelastic Traffic 

    Type: Journal Paper
    Author : Abedini, Navid; Shakkottai, Sanjay
    Publisher: IEEE
    Year: 2014

    Cache in the air: exploiting content caching and delivery techniques for 5G systems 

    Type: Journal Paper
    Author : Xiaofei Wang; Min Chen; Taleb, Tarik; Ksentini, Adlen; Leung, Victor
    Publisher: IEEE
    Year: 2014

    Towards data exchange interoperability in building lifecycle management 

    Type: Conference Paper
    Author : Kubler, Sylvain; Madhikermi, Manik; Buda, Andrea; Framling, Kary; Derigent, William; Thomas, Andre
    Publisher: IEEE
    Year: 2014

    Integrating Trust with Qualitative and Quantitative Preference for Service Selection 

    Type: Conference Paper
    Author : Hongbing Wang; Lei Wang; Chao Yu
    Publisher: IEEE
    Year: 2014

    Design of a wideband 1.5GHz to 3GHz class EF2 power amplifier 

    Type: Conference Paper
    Author : Madureira, H.; Deltimple, N.; Haddad, S.; Belot, D.; Kerherve, E.
    Publisher: IEEE
    Year: 2014

    Depth extraction from a single image by sampling based on distance metric learning 

    Type: Conference Paper
    Author : Tian, Hu; Zhuang, Bojin; Hua, Yan; Cai, Anni
    Publisher: IEEE
    Year: 2014

    The estimation approach of rail thermal stress based on vehicle-track dynamic responses 

    Type: Conference Paper
    Author : Guo, Yishi; Yu, Zujun; Shi, Hongmei; Liqiang Zhu
    Publisher: IEEE
    Year: 2014
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