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    A Power-Efficient CMOS Active Pixel Sensor Imager with Column-Level Difference ADC in 0.18-um 

    Type: Conference Paper
    Author : صالح مسعودیان; رضا لطفی; Saleh Masoodian; Reza Lotfi
    Year: 2012
    Abstract:

    Abstract-In this paper a CMOS active pixel sensor (APS)

    imager with column-level analog-to-digital converter (ADC) is

    presented. In conventional column-level ADC imagers, the ADCs

    are active in the entire readout time intervals...

    Analog to digital front-end board ADVW, for vibrating wire sensor nodes, used in hydrotechnical structures monitoring sensor networks 

    Type: Conference Paper
    Author : Kovacs, I. , Mircea, M. , Gyura, B.
    Publisher: IEEE
    Year: 2014

    A Hybrid Optimization Model for Green Cloud Computing 

    Type: Conference Paper
    Author : Rocha, Lucio A.; Cardozo, Eleri
    Publisher: IEEE
    Year: 2014

    Dependence of the Noise Behavior on the Drain Current for Thin Film Transistors 

    Type: Journal Paper
    Author : Ya-Hsiang Tai; Chun-Yi Chang; Chung-Lun Hsieh; Yung-Hsuan Yang; Wei-Kuang Chao; Huan-Ean Chen
    Publisher: IEEE
    Year: 2014

    Extraction and Estimation of Pinned Photodiode Capacitance in CMOS Image Sensors 

    Type: Journal Paper
    Author : Chao, Calvin Yi-Ping; Yi-Che Chen; Kuo-Yu Chou; Jhy-Jyi Sze; Fu-Lung Hsueh; Shou-Gwo Wuu
    Publisher: IEEE
    Year: 2014

    Exploring the Kinetics of Formation and Annealing of Single Particle Displacement Damage in Microvolumes of Silicon 

    Type: Journal Paper
    Author : Raine, M.; Goiffon, Vincent; Paillet, P.; Duhamel, O.; Girard, S.; Gaillardin, M.; Virmontois, Cedric; Belloir, Jean-Marc; Richard, N.; Magnan, Pierre
    Publisher: IEEE
    Year: 2014

    Study of a Thermal Annealing Approach for Very High Total Dose Environments 

    Type: Journal Paper
    Author : Dhombres, S.; Michez, A.; Boch, J.; Saigne, F.; Beauvivre, S.; Kraehenbuehl, D.; Vaille, J.-R.; Adell, P.C.; Lorfevre, E.; Ecoffet, R.; Roig, Fabien
    Publisher: IEEE
    Year: 2014

    Radiation-Induced Dose and Single Event Effects in Digital CMOS Image Sensors 

    Type: Journal Paper
    Author : Virmontois, Cedric; Toulemont, Arthur; Rolland, G.; Materne, Alex; Lalucaa, Valerian; Goiffon, Vincent; Codreanu, Catalin; Durnez, Clementine; Bardoux, Alain
    Publisher: IEEE
    Year: 2014

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