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    A method for quantitative assessment of artifacts in EEG, and an empirical study of artifacts 

    Type: Conference Paper
    Author : Kappel, S.L.; Looney, D.; Mandic, D.P.; Kidmose, P.
    Publisher: IEEE
    Year: 2014

    Reduction in permittivity of poly(tetrafluoroethylene) due to tensile strain 

    Type: Conference Paper
    Author : Shuaishuai Liu; Bowler, Nicola
    Publisher: IEEE
    Year: 2014

    MOOLs: Massive Open Online Laboratories: An analysis of scale and feasibility 

    Type: Conference Paper
    Author : Lowe, D.
    Publisher: IEEE
    Year: 2014

    Type-aware task placement in geo-distributed data centers with low OPEX using data center resizing 

    Type: Conference Paper
    Author : Lin Gu , Deze Zeng , Song Guo , Shui Yu
    Publisher: IEEE
    Year: 2014

    Kriging bootstrapped neural network training for fast and accurate process variation analysis 

    Type: Conference Paper
    Author : Okobiah, O. , Mohanty, S.P. , Kougianos, E.
    Publisher: IEEE
    Year: 2014

    Hardware-in-the-loop simulation of Android GPGPU applications 

    Type: Conference Paper
    Author : Youngsub Ko; Saehanseul Yi; Youngmin Yi; Myungsun Kim; Soonhoi Ha
    Publisher: IEEE
    Year: 2014

    A Hybrid Microgrid With DC Connection at Back to Back Converters 

    Type: Journal Paper
    Author : Majumder, Ritwik
    Publisher: IEEE
    Year: 2014

    Optimizing DC Voltage Droop Settings for AC/DC System Interactions 

    Type: Journal Paper
    Author : Eriksson, Robert; Beerten, Jef; Ghandhari, M.; Belmans, Ronnie
    Publisher: IEEE
    Year: 2014

    Control Strategies for AC Fault Ride Through in Multiterminal HVDC Grids 

    Type: Journal Paper
    Author : Silva, Bruno; Moreira, C.L.; Leite, Helder; Lopes, J. /A/. Pecas
    Publisher: IEEE
    Year: 2014

    Direct-Current Predictive Control Strategy for Inhibiting Commutation Failure in HVDC Converter 

    Type: Journal Paper
    Author : Zhinong Wei; Yang Yuan; Xiao Lei; Huawei Wang; Guoqiang Sun; Yonghui Sun
    Publisher: IEEE
    Year: 2014
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