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نمایش تعداد 151-160 از 13

n device-level PBTI-induced timing jitter (1)
n edge conduction effect (1)
n EKV3 advanced compact MOSFET model (1)
n Electrical resistance measurement (1)
n eye-diagram measur (1)
n H-bridge DC-DC convertor topology (1)
n integrated circuit design (1)
n integrated circuit measurement (1)
n Integrated circuit modeling (1)
n inverter-level DC measurements (1)