Advanced soft fail characterization methodology for sub-28nm nanoscale SRAM yield improvement
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Year
: 2014DOI: 10.1109/ICITCS.2014.7021718
Keyword(s): Broadcasting,Digital TV,Noise,Standards,Stress,Volume measurement
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Advanced soft fail characterization methodology for sub-28nm nanoscale SRAM yield improvement
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| date accessioned | 2020-03-12T20:01:45Z | |
| date available | 2020-03-12T20:01:45Z | |
| date issued | 2014 | |
| identifier other | 6846953.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/999112?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Advanced soft fail characterization methodology for sub-28nm nanoscale SRAM yield improvement | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8119404 | |
| subject keywords | Broadcasting | |
| subject keywords | Digital TV | |
| subject keywords | Noise | |
| subject keywords | Standards | |
| subject keywords | Stress | |
| subject keywords | Volume measurement | |
| identifier doi | 10.1109/ICITCS.2014.7021718 | |
| journal title | dvanced Semiconductor Manufacturing Conference (ASMC), 2014 25th Annual SEMI | |
| filesize | 750713 | |
| citations | 0 | |
| contributor rawauthor | Jianhua Yin , Fernandes, S. , Yinzhe Ma , Sheng Xie , Xuemei Liu , Qiushi Wang , Dexter, M. , Meixiong Zhao , Mann, R. , Chong Khiam Oh , Tay, M. , Lim, S.K. , Dapeng Sun , Chao, P. , Lam, J. |