Motion Planning of Multi-docking System for Intelligent Mobile Robots
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Year
: 2014DOI: 10.1109/ICSICT.2014.7021291
Keyword(s): MOSFET,interface states,semiconductor device models,semiconductor device reliability,BTI stresses,IV measurement,Si-SiO<,sub>,2<,/sub>,interface trap density,n-type interfaces,p-type interfaces,Abstracts,Area measurement,Current measurement,Logic gates,Performance evaluation,Reliability,Substrates
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Motion Planning of Multi-docking System for Intelligent Mobile Robots
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| contributor author | Su, K.L. , Li, B.Y. , Guo, J.H. , Liao, Y.L. | |
| date accessioned | 2020-03-12T20:01:02Z | |
| date available | 2020-03-12T20:01:02Z | |
| date issued | 2014 | |
| identifier other | 6846122.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/998698 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Motion Planning of Multi-docking System for Intelligent Mobile Robots | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8118926 | |
| subject keywords | MOSFET | |
| subject keywords | interface states | |
| subject keywords | semiconductor device models | |
| subject keywords | semiconductor device reliability | |
| subject keywords | BTI stresses | |
| subject keywords | IV measurement | |
| subject keywords | Si-SiO< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | interface trap density | |
| subject keywords | n-type interfaces | |
| subject keywords | p-type interfaces | |
| subject keywords | Abstracts | |
| subject keywords | Area measurement | |
| subject keywords | Current measurement | |
| subject keywords | Logic gates | |
| subject keywords | Performance evaluation | |
| subject keywords | Reliability | |
| subject keywords | Substrates | |
| identifier doi | 10.1109/ICSICT.2014.7021291 | |
| journal title | omputer, Consumer and Control (IS3C), 2014 International Symposium on | |
| filesize | 278806 | |
| citations | 0 |