A Study of Patients with Higher Medical Expenses in DRG 124 - A Regional Hospital as Case

نویسنده:
ناشر:
سال
: 2014
شناسه الکترونیک: 10.1109/ICSICT.2014.7021207
کلیدواژه(گان): CMOS integrated circuits,MOSFET,SRAM chips,lithography,low-power electronics,CMOS platform technology,CPP,FinFET technology,MWF gate stack,RDF,SNM,SOI substrates,bulk substrates,contacted poly pitch,lithography,metallization pitch,multipatterning technology,multiworkfunction gate stack,optical patterning limits,random dopant fluctuation,self-aligned processes,size 10 nm,size 48 nm,static noise margin,variability degradation,voltage 0.75 V,voltage 140 mV,Abstracts,Logi
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