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MIAMI: A framework for application performance diagnosis

contributor authorMarin, G. , Dongarra, J. , Terpstra, D.
date accessioned2020-03-12T19:59:07Z
date available2020-03-12T19:59:07Z
date issued2014
identifier other6844480.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/997566?show=full
formatgeneral
languageEnglish
publisherIEEE
titleMIAMI: A framework for application performance diagnosis
typeConference Paper
contenttypeMetadata Only
identifier padid8117542
subject keywordsYoung'
subject keywordss modulus
subject keywordsaluminium
subject keywordselectrical resistivity
subject keywordselemental semiconductors
subject keywordsmicroactuators
subject keywordsmicromachining
subject keywordssilicon
subject keywordssilicon compounds
subject keywordsthermal conductivity
subject keywordsAl
subject keywordsPolyMEMS-INAOE fabrication process
subject keywordsSi
subject keywordsSiN
subject keywordsSiO<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsYoung'
subject keywordss modulus
subject keywordsbulk-surface micromachined polyMEMS test chip
subject keywordscompression stresses
subject keywordsdoping level
subject keywordselectrical property characterization
subject keywordselectrical resistivity
subject keywordsmechanical actuators
subject keywordsmechanical properties
subject keywordsmonocrystalline silicon
subject keywordsphosphosilicate glas
identifier doi10.1109/ICCDCS.2014.7016162
journal titleerformance Analysis of Systems and Software (ISPASS), 2014 IEEE International Symposium on
filesize1035003
citations0


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