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Test structure to evaluate the impact of neighboring features on stress of metal interconnects

contributor authorSmith, B. , Shroff, M.
date accessioned2020-03-12T19:56:26Z
date available2020-03-12T19:56:26Z
date issued2014
identifier other6841495.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/995962?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleTest structure to evaluate the impact of neighboring features on stress of metal interconnects
typeConference Paper
contenttypeMetadata Only
identifier padid8115598
subject keywordsElectronic learning
subject keywordsManuals
subject keywordsMedia
subject keywordsMultimedia communication
subject keywordsStreaming media
subject keywordsTV
subject keywordsInteractive video content, e
subject keywordsinteractive manuals
subject keywordslearning editor and authoring tool
subject keywordsuser interaction
identifier doi10.1109/ICWOAL.2014.7009245
journal titleicroelectronic Test Structures (ICMTS), 2014 International Conference on
filesize1368971
citations0


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