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Effective field and universal mobility in high-k metal gate UTBB-FDSOI devices

contributor author, J.C. , Tavernier, C. , Jaouen, H.
date accessioned2020-03-12T19:56:23Z
date available2020-03-12T19:56:23Z
date issued2014
identifier other6841460.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/995924?show=full
formatgeneral
languageEnglish
publisherIEEE
titleEffective field and universal mobility in high-k metal gate UTBB-FDSOI devices
typeConference Paper
contenttypeMetadata Only
identifier padid8115557
subject keywordsCollaborative work
subject keywordsComputer architecture
subject keywordsComputers
subject keywordsEducation
subject keywordsLogic gates
subject keywordsRadiofrequency identification
subject keywordsUbiquitous computing
subject keywordsCollaborative learning
subject keywordsEducation
subject keywordsGateway
subject keywordsSmart Classroom
subject keywordsUbiquitous computing
identifier doi10.1109/ICWOAL.2014.7009206
journal titleicroelectronic Test Structures (ICMTS), 2014 International Conference on
filesize524523
citations0
contributor rawauthorNier, O. , Rideau, D. , Cros, A. , Monsieur, F. , Ghibaudo, G. , Clerc, R. , Barbé


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