Minimizing Cost of K-Replica in Hierarchical Data Grid Environment
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Year
: 2014DOI: 10.1109/VLSI-SoC.2014.7004189
Keyword(s): Circuit faults,Ferrites,Probes,Sensors,System-on-chip,Voltage measurement
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Minimizing Cost of K-Replica in Hierarchical Data Grid Environment
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| contributor author | Mansouri, Y. , Azad, S.T. , Chamkori, A. | |
| date accessioned | 2020-03-12T19:54:19Z | |
| date available | 2020-03-12T19:54:19Z | |
| date issued | 2014 | |
| identifier other | 6838783.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/994589?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Minimizing Cost of K-Replica in Hierarchical Data Grid Environment | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8114016 | |
| subject keywords | Circuit faults | |
| subject keywords | Ferrites | |
| subject keywords | Probes | |
| subject keywords | Sensors | |
| subject keywords | System-on-chip | |
| subject keywords | Voltage measurement | |
| identifier doi | 10.1109/VLSI-SoC.2014.7004189 | |
| journal title | dvanced Information Networking and Applications (AINA), 2014 IEEE 28th International Conference on | |
| filesize | 276827 | |
| citations | 0 |