Minimizing Cost of K-Replica in Hierarchical Data Grid Environment
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سال
: 2014شناسه الکترونیک: 10.1109/VLSI-SoC.2014.7004189
کلیدواژه(گان): Circuit faults,Ferrites,Probes,Sensors,System-on-chip,Voltage measurement
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Minimizing Cost of K-Replica in Hierarchical Data Grid Environment
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contributor author | Mansouri, Y. , Azad, S.T. , Chamkori, A. | |
date accessioned | 2020-03-12T19:54:19Z | |
date available | 2020-03-12T19:54:19Z | |
date issued | 2014 | |
identifier other | 6838783.pdf | |
identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/994589 | |
format | general | |
language | English | |
publisher | IEEE | |
title | Minimizing Cost of K-Replica in Hierarchical Data Grid Environment | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8114016 | |
subject keywords | Circuit faults | |
subject keywords | Ferrites | |
subject keywords | Probes | |
subject keywords | Sensors | |
subject keywords | System-on-chip | |
subject keywords | Voltage measurement | |
identifier doi | 10.1109/VLSI-SoC.2014.7004189 | |
journal title | dvanced Information Networking and Applications (AINA), 2014 IEEE 28th International Conference on | |
filesize | 276827 | |
citations | 0 |