| contributor author | Chang Hao , Liang Huaguo , Li Yang , Ouyang Yiming | |
| date accessioned | 2020-03-12T19:51:16Z | |
| date available | 2020-03-12T19:51:16Z | |
| date issued | 2014 | |
| identifier other | 6834877.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/992582?show=full | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Optimized stacking order for 3D-stacked ICs considering the probability and cost of failed bonding | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8111685 | |
| subject keywords | Carbon nanotubes | |
| subject keywords | Laboratories | |
| subject keywords | Materials | |
| subject keywords | Nanomaterials | |
| subject keywords | Protocols | |
| subject keywords | Safety | |
| subject keywords | Safety handling | |
| subject keywords | carbon nanotubes | |
| subject keywords | nanotechnology | |
| subject keywords | occupational health | |
| subject keywords | risk management | |
| identifier doi | 10.1109/IBERSENSOR.2014.6995538 | |
| journal title | LSI Design, Automation and Test (VLSI-DAT), 2014 International Symposium on | |
| filesize | 557784 | |
| citations | 0 | |
