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Efficient SMT-based ATPG for interconnect open defects

contributor authorErb, D. , Scheibler, K. , Sauer, M. , Becker, B.
date accessioned2020-03-12T19:40:27Z
date available2020-03-12T19:40:27Z
date issued2014
identifier other6800339.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/985738?show=full
formatgeneral
languageEnglish
publisherIEEE
titleEfficient SMT-based ATPG for interconnect open defects
typeConference Paper
contenttypeMetadata Only
identifier padid8101423
subject keywordsCMOS integrated circuits
subject keywordsenergy conservation
subject keywordsintegrated circuit design
subject keywordslow-power electronics
subject keywordsmixed analogue-digital integrated circuits
subject keywordspower amplifiers
subject keywordsradio transceivers
subject keywordsradiofrequency amplifiers
subject keywordssignal processing
subject keywordsCMOS power amplifier
subject keywordsCMOS process
subject keywordsIII-V HBT PA solutions
subject keywordsRF CMOS PA
subject keywordsRF power amplifier
subject keywordsanalog processing capability
subject keywordsanalog techniques
subject keywordsarea efficiency
subject keywordscircuit design techniques
subject keywordscomputational processing capability
subject keywordsdigital processing capability
subject keywordsdigital techniques
subject keywordsin
identifier doi10.1109/CICC.2014.6946038
journal titleesign, Automation and Test in Europe Conference and Exhibition (DATE), 2014
filesize500524
citations0


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