2014 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) [Copyright notice]
Year
: 2014DOI: 10.1109/PVSC.2014.6925020
Keyword(s): aluminium compounds,elemental semiconductors,interface states,passivation,silicon,silicon compounds,solar cells,space charge,surface recombination,Interface trap density data,PV emitter passivation,Si-Al<,sub>,2<,/sub>,O<,sub>,3<,/sub>,Si-SiN,Surface Recombination,defective wafer areas elimination,dielectric charge,emitter saturation current,field effect passivation effectiveness,heterointerface,interface trapped charge,low J<,sub>,o<,/sub>,field eff
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2014 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) [Copyright notice]
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| date accessioned | 2020-03-12T19:30:29Z | |
| date available | 2020-03-12T19:30:29Z | |
| date issued | 2014 | |
| identifier other | 6740172.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/980034 | |
| format | general | |
| language | English | |
| title | 2014 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) [Copyright notice] | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8094243 | |
| subject keywords | aluminium compounds | |
| subject keywords | elemental semiconductors | |
| subject keywords | interface states | |
| subject keywords | passivation | |
| subject keywords | silicon | |
| subject keywords | silicon compounds | |
| subject keywords | solar cells | |
| subject keywords | space charge | |
| subject keywords | surface recombination | |
| subject keywords | Interface trap density data | |
| subject keywords | PV emitter passivation | |
| subject keywords | Si-Al< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | O< | |
| subject keywords | sub> | |
| subject keywords | 3< | |
| subject keywords | /sub> | |
| subject keywords | Si-SiN | |
| subject keywords | Surface Recombination | |
| subject keywords | defective wafer areas elimination | |
| subject keywords | dielectric charge | |
| subject keywords | emitter saturation current | |
| subject keywords | field effect passivation effectiveness | |
| subject keywords | heterointerface | |
| subject keywords | interface trapped charge | |
| subject keywords | low J< | |
| subject keywords | sub> | |
| subject keywords | o< | |
| subject keywords | /sub> | |
| subject keywords | field eff | |
| identifier doi | 10.1109/PVSC.2014.6925020 | |
| journal title | lectronics, Computing and Communication Technologies (IEEE CONECCT), 2014 IEEE International Confere | |
| filesize | 84047 | |
| citations | 0 |