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contributor authorCheng-Lun Hsin
contributor authorShang-Ming Wang
date accessioned2020-03-12T18:45:22Z
date available2020-03-12T18:45:22Z
date issued2014
identifier issn1536-125X
identifier other6733346.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/969075?show=full
formatgeneral
languageEnglish
publisherIEEE
titleStructural, Electrical, and Optical Properties of Faceted In<formula formulatype="inline"> <img src="/images/tex/21142.gif" alt="_{2}"> </formula>O<formula formulatype="inline"> <img src="/images/tex/602.gif" alt="_{3}"> </formula> Nanostructures
typeJournal Paper
contenttypeMetadata Only
identifier padid8003314
subject keywordscarrier density
subject keywordselectrical conductivity
subject keywordsindium compounds
subject keywordsnanofabrication
subject keywordsnanorods
subject keywordsphotoluminescence
subject keywordsrough surfaces
subject keywordssurface energy
subject keywordstransmission electron microscopy
subject keywordsIn<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordsO<
subject keywordssub>
subject keywords3<
subject keywords/sub>
subject keywordsSiO<
subject keywordssub>
subject keywords2<
subject keywords/sub>
subject keywordscarrier concentration
subject keywordscatalyst
subject keywordsconductivity
subject keywordselectrical properties
subject keywordsgrowth mechanism
subject keywordsgrowth temperature
subject keywordsnanorods
subject keywordsoptical properties
subject keywordsphotoluminescence
subject keywordsphysical properties
subject keywordssilicon oxide substrate
subject keywordsstructural properties
subject keywordssurface energy
subject keywordstran
identifier doi10.1109/TNANO.2014.2304963
journal titleNanotechnology, IEEE Transactions on
journal volume13
journal issue2
filesize330185
citations0


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