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Characterization and Scalable Modeling of Power Semiconductors for Optimized Design of Traction Inverters with Si- and SiC-Devices

Author:
Merkert, Arvid
,
Krone, T.
,
Mertens, Axel
Publisher:
IEEE
Year
: 2014
DOI: 10.1109/TPEL.2013.2294682
URI: https://libsearch.um.ac.ir:443/fum/handle/fum/963694
Keyword(s): MOSFET,hybrid electric vehicles,invertors,junction gate field effect transistors,optimisation,power semiconductor devices,silicon compounds,traction,wide band gap semiconductors,SiC,hybrid electric vehicle traction inverters,inverter efficiency,maximum permissible junction temperature,optimized design,power semiconductors,scalable loss,scalable thermal modeling,standardized drive cycles,switching frequencies,system power density,thermal electrical coupled semiconductor models
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    Characterization and Scalable Modeling of Power Semiconductors for Optimized Design of Traction Inverters with Si- and SiC-Devices

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contributor authorMerkert, Arvid
contributor authorKrone, T.
contributor authorMertens, Axel
date accessioned2020-03-12T18:35:39Z
date available2020-03-12T18:35:39Z
date issued2014
identifier issn0885-8993
identifier other6680725.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/963694
formatgeneral
languageEnglish
publisherIEEE
titleCharacterization and Scalable Modeling of Power Semiconductors for Optimized Design of Traction Inverters with Si- and SiC-Devices
typeJournal Paper
contenttypeMetadata Only
identifier padid7997052
subject keywordsMOSFET
subject keywordshybrid electric vehicles
subject keywordsinvertors
subject keywordsjunction gate field effect transistors
subject keywordsoptimisation
subject keywordspower semiconductor devices
subject keywordssilicon compounds
subject keywordstraction
subject keywordswide band gap semiconductors
subject keywordsSiC
subject keywordshybrid electric vehicle traction inverters
subject keywordsinverter efficiency
subject keywordsmaximum permissible junction temperature
subject keywordsoptimized design
subject keywordspower semiconductors
subject keywordsscalable loss
subject keywordsscalable thermal modeling
subject keywordsstandardized drive cycles
subject keywordsswitching frequencies
subject keywordssystem power density
subject keywordsthermal electrical coupled semiconductor models
identifier doi10.1109/TPEL.2013.2294682
journal titlePower Electronics, IEEE Transactions on
journal volume29
journal issue5
filesize2284394
citations0
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