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Effect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films

contributor authorLampasi, Domenico Alessandro
contributor authorTamburrano, Alessio
contributor authorBellini, Sandro
contributor authorTului, Mario
contributor authorAlbolino, Augusto
contributor authorSarto, M.S.
date accessioned2020-03-12T18:30:31Z
date available2020-03-12T18:30:31Z
date issued2014
identifier issn0018-9375
identifier other6642087.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/960848?show=full
formatgeneral
languageEnglish
publisherIEEE
titleEffect of Grain Size and Distribution on the Shielding Effectiveness of Transparent Conducting Thin Films
typeJournal Paper
contenttypeMetadata Only
identifier padid7993555
subject keywordselectrical engineering computing
subject keywordselectromagnetic shielding
subject keywordsnanotechnology
subject keywordsscanning electron microscopes
subject keywordssoftware tools
subject keywordssputter deposition
subject keywordsstatistical distributions
subject keywordsthin films
subject keywordstransparency
subject keywordsfilm surface grains
subject keywordsfitting models
subject keywordshigh radio frequency shielding effectiveness
subject keywordsmagnetron sputtering
subject keywordsnanostructured thin films
subject keywordsscanning electron microscope
subject keywordsstatistical distributions
subject keywordstransparent conducting thin film
subject keywordsFrequency measurement
subject keywordsGrain size
subject keywordsOptical films
subject keywordsOptical imaging
subject keywordsSubstrates
subject keywordsS
identifier doi10.1109/TEMC.2013.2282085
journal titleElectromagnetic Compatibility, IEEE Transactions on
journal volume56
journal issue2
filesize1174671
citations0


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