Reliability of semiconductor RAMs with soft-error scrubbing techniques
Author:
Year
: 1995DOI: 10.1049/ip-cdt:19952162
Collections
:
-
Statistics
Reliability of semiconductor RAMs with soft-error scrubbing techniques
Show full item record
| contributor author | Yang, G.-C. | |
| date accessioned | 2020-03-12T12:54:31Z | |
| date available | 2020-03-12T12:54:31Z | |
| date issued | 1995 | |
| identifier other | zkXl73I9HHJY5j8mNfQFHwK5kj4_bPJ5J9wV2LfUBRL1jj1qfI.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/875622 | |
| format | general | |
| language | English | |
| title | Reliability of semiconductor RAMs with soft-error scrubbing techniques | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 6985760 | |
| identifier doi | 10.1049/ip-cdt:19952162 | |
| coverage | Academic | |
| pages | 337-0 | |
| journal volume | 142 | |
| journal issue | 5 | |
| filesize | 558371 | |
| citations | 1 |