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Analysis of DIBL Effect and Negative Resistance Performance for NCFET Based on a Compact SPICE Model

contributor authorYuhua Liang
contributor authorXueqing Li
contributor authorSumeet Kumar Gupta
contributor authorSuman Datta
contributor authorVijaykrishnan Narayanan
date accessioned2020-03-16T10:44:14Z
date available2020-03-16T10:44:14Z
date issued2018
identifier otherYz9qX9zkZJipKnPbmF3PI0bRYiFMQLl9IBJlJfaBTY2TnV840i.pdf
identifier urihttps://libsearch.um.ac.ir:443/fum/handle/fum/2262310?show=full
formatgeneral
languageEnglish
titleAnalysis of DIBL Effect and Negative Resistance Performance for NCFET Based on a Compact SPICE Model
typeJournal Paper
contenttypeFulltext
contenttypeFulltext
identifier padid15090960
identifier doi10.1109/TED.2018.2875661
journal titleIEEE Transactions on Electron Devices
coverageAcademic
pages1-5
filesize1639821
citations2


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