Probing the new IEEE Reliability Test System (RTS-96): HL-II assessment
سال
: 1998شناسه الکترونیک: 10.1109/59.651632
کالکشن
:
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آمار بازدید
Probing the new IEEE Reliability Test System (RTS-96): HL-II assessment
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| contributor author | Pinheiro, J.M.S. | |
| contributor author | Dornellas, C.R.R. | |
| contributor author | Schilling, M.Th. | |
| contributor author | Melo, A.C.G. | |
| contributor author | Mello, J.C.O. | |
| date accessioned | 2020-03-14T10:07:37Z | |
| date available | 2020-03-14T10:07:37Z | |
| date issued | 1998 | |
| identifier other | O068BNsxzcIhj8wrDfcJx_7cwGJhLwhL4OEckb_EruUpccKsWH.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1614739 | |
| format | general | |
| language | English | |
| title | Probing the new IEEE Reliability Test System (RTS-96): HL-II assessment | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 11678344 | |
| identifier doi | 10.1109/59.651632 | |
| coverage | Academic | |
| pages | 0-176 | |
| journal volume | 13 | |
| journal issue | 1 | |
| filesize | 649464 | |
| citations | 1 |