[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - FRA vs. short circuit impedance measurement in detection of mechanical defects within large power transformer
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: 2012DOI: 10.1109/elinsl.2012.6251477
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[IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - FRA vs. short circuit impedance measurement in detection of mechanical defects within large power transformer
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| contributor author | Bagheri, Mehdi | |
| contributor author | Naderi, Mohammad Salay | |
| contributor author | Blackburn, Trevor | |
| contributor author | Phung, Toan | |
| date accessioned | 2020-03-14T10:05:43Z | |
| date available | 2020-03-14T10:05:43Z | |
| date issued | 2012 | |
| identifier other | vcaFG6SVb5wSh4mZkot3AfTv9ZqhmtP6GRceuW9uccx_V1c3nL.pdf | |
| identifier uri | https://libsearch.um.ac.ir:443/fum/handle/fum/1614344 | |
| format | general | |
| language | English | |
| title | [IEEE 2012 IEEE International Symposium on Electrical Insulation (ISEI) - San Juan, PR, USA (2012.06.10-2012.06.13)] 2012 IEEE International Symposium on Electrical Insulation - FRA vs. short circuit impedance measurement in detection of mechanical defects within large power transformer | |
| type | Journal Paper | |
| contenttype | Fulltext | |
| contenttype | Fulltext | |
| identifier padid | 11676421 | |
| identifier doi | 10.1109/elinsl.2012.6251477 | |
| coverage | Academic | |
| pages | 301-305 | |
| filesize | 610696 | |
| citations | 0 |